[{"type":"conference","publication":"SPE ANTEC","year":"2019","citation":{"apa":"Malatyali, H., Schöppner, V., Tillmann, W., &#38; Kokalj, D. (2019). Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements. <i>SPE ANTEC</i>.","bibtex":"@inproceedings{Malatyali_Schöppner_Tillmann_Kokalj_2019, title={Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements}, booktitle={SPE ANTEC}, author={Malatyali, Hatice and Schöppner, Volker and Tillmann, Wolfgang and Kokalj, David}, year={2019} }","short":"H. Malatyali, V. Schöppner, W. Tillmann, D. Kokalj, in: SPE ANTEC, 2019.","mla":"Malatyali, Hatice, et al. “Deveploment of Thin Film Sensors: The Influence of Layer Variation on the Measurement Quality for Inline Melt Temperature Measurements.” <i>SPE ANTEC</i>, 2019.","ieee":"H. Malatyali, V. Schöppner, W. Tillmann, and D. Kokalj, “Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements,” 2019.","chicago":"Malatyali, Hatice, Volker Schöppner, Wolfgang Tillmann, and David Kokalj. “Deveploment of Thin Film Sensors: The Influence of Layer Variation on the Measurement Quality for Inline Melt Temperature Measurements.” In <i>SPE ANTEC</i>, 2019.","ama":"Malatyali H, Schöppner V, Tillmann W, Kokalj D. Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements. In: <i>SPE ANTEC</i>. ; 2019."},"status":"public","date_updated":"2022-01-06T06:56:17Z","_id":"24322","user_id":"30479","date_created":"2021-09-14T07:44:42Z","author":[{"first_name":"Hatice","full_name":"Malatyali, Hatice","id":"30479","last_name":"Malatyali"},{"first_name":"Volker","full_name":"Schöppner, Volker","last_name":"Schöppner"},{"last_name":"Tillmann","full_name":"Tillmann, Wolfgang","first_name":"Wolfgang"},{"full_name":"Kokalj, David","last_name":"Kokalj","first_name":"David"}],"title":"Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements","language":[{"iso":"eng"}]}]