{"language":[{"iso":"eng"}],"publication":"SPE ANTEC","type":"conference","date_updated":"2022-01-06T06:56:17Z","author":[{"first_name":"Hatice","last_name":"Malatyali","id":"30479","full_name":"Malatyali, Hatice"},{"full_name":"Schöppner, Volker","last_name":"Schöppner","first_name":"Volker"},{"full_name":"Tillmann, Wolfgang","last_name":"Tillmann","first_name":"Wolfgang"},{"last_name":"Kokalj","full_name":"Kokalj, David","first_name":"David"}],"status":"public","year":"2019","citation":{"bibtex":"@inproceedings{Malatyali_Schöppner_Tillmann_Kokalj_2019, title={Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements}, booktitle={SPE ANTEC}, author={Malatyali, Hatice and Schöppner, Volker and Tillmann, Wolfgang and Kokalj, David}, year={2019} }","chicago":"Malatyali, Hatice, Volker Schöppner, Wolfgang Tillmann, and David Kokalj. “Deveploment of Thin Film Sensors: The Influence of Layer Variation on the Measurement Quality for Inline Melt Temperature Measurements.” In SPE ANTEC, 2019.","short":"H. Malatyali, V. Schöppner, W. Tillmann, D. Kokalj, in: SPE ANTEC, 2019.","mla":"Malatyali, Hatice, et al. “Deveploment of Thin Film Sensors: The Influence of Layer Variation on the Measurement Quality for Inline Melt Temperature Measurements.” SPE ANTEC, 2019.","ama":"Malatyali H, Schöppner V, Tillmann W, Kokalj D. Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements. In: SPE ANTEC. ; 2019.","ieee":"H. Malatyali, V. Schöppner, W. Tillmann, and D. Kokalj, “Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements,” 2019.","apa":"Malatyali, H., Schöppner, V., Tillmann, W., & Kokalj, D. (2019). Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements. SPE ANTEC."},"user_id":"30479","date_created":"2021-09-14T07:44:42Z","_id":"24322","title":"Deveploment of thin film sensors: The influence of layer variation on the measurement quality for inline melt temperature measurements"}