{"date_updated":"2022-01-25T18:21:59Z","year":"2017","language":[{"iso":"eng"}],"title":"Automated Model Verification using an Equivalence Test on a Reference Model","_id":"25077","citation":{"chicago":"Akin, Akbulut, Abke Stephan , and Laroque Christoph. “Automated Model Verification Using an Equivalence Test on a Reference Model.” In Proceedings of the 2017 Winter Simulation Conference (Accepted), edited by Chan W. K. V, A D’Ambrogio, G Zacharewicz, N Mustafee, G Wainer, and E Page. Institute of Electrical and Electronics Engineers, Inc., n.d.","bibtex":"@inproceedings{Akin_ Stephan _Christoph, title={Automated Model Verification using an Equivalence Test on a Reference Model}, booktitle={Proceedings of the 2017 Winter Simulation Conference (accepted)}, publisher={Institute of Electrical and Electronics Engineers, Inc.}, author={Akin, Akbulut and Stephan , Abke and Christoph, Laroque}, editor={ W. K. V, Chan and D’Ambrogio, A and Zacharewicz, G and Mustafee, N and Wainer, G and Page, E} }","ieee":"A. Akin, A. Stephan , and Laroque Christoph, “Automated Model Verification using an Equivalence Test on a Reference Model,” in Proceedings of the 2017 Winter Simulation Conference (accepted).","mla":"Akin, Akbulut, et al. “Automated Model Verification Using an Equivalence Test on a Reference Model.” Proceedings of the 2017 Winter Simulation Conference (Accepted), edited by Chan W. K. V et al., Institute of Electrical and Electronics Engineers, Inc.","short":"A. Akin, A. Stephan , Laroque Christoph, in: C. W. K. V, A. D’Ambrogio, G Zacharewicz, N. Mustafee, G. Wainer, E. Page (Eds.), Proceedings of the 2017 Winter Simulation Conference (Accepted), Institute of Electrical and Electronics Engineers, Inc., n.d.","apa":"Akin, A., Stephan , A., & Christoph, Laroque. (n.d.). Automated Model Verification using an Equivalence Test on a Reference Model. In C. W. K. V, A. D’Ambrogio, G Zacharewicz, N. Mustafee, G. Wainer, & E. Page (Eds.), Proceedings of the 2017 Winter Simulation Conference (accepted). Institute of Electrical and Electronics Engineers, Inc.","ama":"Akin A, Stephan A, Christoph Laroque. Automated Model Verification using an Equivalence Test on a Reference Model. In: W. K. V C, D’Ambrogio A, Zacharewicz G, Mustafee N, Wainer G, Page E, eds. Proceedings of the 2017 Winter Simulation Conference (Accepted). Institute of Electrical and Electronics Engineers, Inc."},"author":[{"full_name":"Akin, Akbulut","first_name":"Akbulut","last_name":"Akin"},{"full_name":" Stephan , Abke","first_name":"Abke","last_name":" Stephan "},{"full_name":"Christoph, Laroque","first_name":" Laroque","last_name":"Christoph"}],"editor":[{"last_name":" W. K. V","first_name":"Chan","full_name":" W. K. V, Chan"},{"last_name":"D’Ambrogio","first_name":"A","full_name":"D’Ambrogio, A"},{"full_name":"Zacharewicz, G","last_name":"Zacharewicz","first_name":" G"},{"full_name":"Mustafee, N","last_name":"Mustafee","first_name":"N"},{"last_name":"Wainer","first_name":"G","full_name":"Wainer, G"},{"full_name":"Page, E","last_name":"Page","first_name":"E"}],"publisher":"Institute of Electrical and Electronics Engineers, Inc.","status":"public","publication_status":"accepted","user_id":"71124","date_created":"2021-09-28T12:20:12Z","publication":"Proceedings of the 2017 Winter Simulation Conference (accepted)","type":"conference"}