{"publication":"Proceedings of the 2017 Winter Simulation Conference (accepted)","citation":{"ieee":"A. Akin, A. Stephan , and Laroque Christoph, “Automated Model Verification using an Equivalence Test on a Reference Model,” in Proceedings of the 2017 Winter Simulation Conference (accepted).","mla":"Akin, Akbulut, et al. “Automated Model Verification Using an Equivalence Test on a Reference Model.” Proceedings of the 2017 Winter Simulation Conference (Accepted), edited by Chan W. K. V et al., Institute of Electrical and Electronics Engineers, Inc.","apa":"Akin, A., Stephan , A., & Christoph, Laroque. (n.d.). Automated Model Verification using an Equivalence Test on a Reference Model. In C. W. K. V, A. D’Ambrogio, G Zacharewicz, N. Mustafee, G. Wainer, & E. Page (Eds.), Proceedings of the 2017 Winter Simulation Conference (accepted). Institute of Electrical and Electronics Engineers, Inc.","bibtex":"@inproceedings{Akin_ Stephan _Christoph, title={Automated Model Verification using an Equivalence Test on a Reference Model}, booktitle={Proceedings of the 2017 Winter Simulation Conference (accepted)}, publisher={Institute of Electrical and Electronics Engineers, Inc.}, author={Akin, Akbulut and Stephan , Abke and Christoph, Laroque}, editor={ W. K. V, Chan and D’Ambrogio, A and Zacharewicz, G and Mustafee, N and Wainer, G and Page, E} }","short":"A. Akin, A. Stephan , Laroque Christoph, in: C. W. K. V, A. D’Ambrogio, G Zacharewicz, N. Mustafee, G. Wainer, E. Page (Eds.), Proceedings of the 2017 Winter Simulation Conference (Accepted), Institute of Electrical and Electronics Engineers, Inc., n.d.","ama":"Akin A, Stephan A, Christoph Laroque. Automated Model Verification using an Equivalence Test on a Reference Model. In: W. K. V C, D’Ambrogio A, Zacharewicz G, Mustafee N, Wainer G, Page E, eds. Proceedings of the 2017 Winter Simulation Conference (Accepted). Institute of Electrical and Electronics Engineers, Inc.","chicago":"Akin, Akbulut, Abke Stephan , and Laroque Christoph. “Automated Model Verification Using an Equivalence Test on a Reference Model.” In Proceedings of the 2017 Winter Simulation Conference (Accepted), edited by Chan W. K. V, A D’Ambrogio, G Zacharewicz, N Mustafee, G Wainer, and E Page. Institute of Electrical and Electronics Engineers, Inc., n.d."},"date_created":"2021-09-28T12:20:12Z","type":"conference","year":"2017","title":"Automated Model Verification using an Equivalence Test on a Reference Model","status":"public","author":[{"full_name":"Akin, Akbulut","first_name":"Akbulut","last_name":"Akin"},{"first_name":"Abke","last_name":" Stephan ","full_name":" Stephan , Abke"},{"first_name":" Laroque","last_name":"Christoph","full_name":"Christoph, Laroque"}],"publication_status":"accepted","date_updated":"2022-01-25T18:21:59Z","publisher":"Institute of Electrical and Electronics Engineers, Inc.","_id":"25077","language":[{"iso":"eng"}],"user_id":"71124","editor":[{"full_name":" W. K. V, Chan","first_name":"Chan","last_name":" W. K. V"},{"last_name":"D’Ambrogio","first_name":"A","full_name":"D’Ambrogio, A"},{"first_name":" G","last_name":"Zacharewicz","full_name":"Zacharewicz, G"},{"full_name":"Mustafee, N","first_name":"N","last_name":"Mustafee"},{"full_name":"Wainer, G","first_name":"G","last_name":"Wainer"},{"full_name":"Page, E","last_name":"Page","first_name":"E"}]}