{"year":"2017","_id":"25077","title":"Automated Model Verification using an Equivalence Test on a Reference Model","citation":{"ieee":"A. Akin, A.  Stephan , and  Laroque Christoph, “Automated Model Verification using an Equivalence Test on a Reference Model,” in <i>Proceedings of the 2017 Winter Simulation Conference (accepted)</i>.","mla":"Akin, Akbulut, et al. “Automated Model Verification Using an Equivalence Test on a Reference Model.” <i>Proceedings of the 2017 Winter Simulation Conference (Accepted)</i>, edited by Chan  W. K. V et al., Institute of Electrical and Electronics Engineers, Inc.","bibtex":"@inproceedings{Akin_ Stephan _Christoph, title={Automated Model Verification using an Equivalence Test on a Reference Model}, booktitle={Proceedings of the 2017 Winter Simulation Conference (accepted)}, publisher={Institute of Electrical and Electronics Engineers, Inc.}, author={Akin, Akbulut and  Stephan , Abke and Christoph,  Laroque}, editor={ W. K. V, Chan and D’Ambrogio, A and Zacharewicz,  G and Mustafee, N and Wainer, G and Page, E} }","ama":"Akin A,  Stephan  A, Christoph  Laroque. Automated Model Verification using an Equivalence Test on a Reference Model. In:  W. K. V C, D’Ambrogio A, Zacharewicz  G, Mustafee N, Wainer G, Page E, eds. <i>Proceedings of the 2017 Winter Simulation Conference (Accepted)</i>. Institute of Electrical and Electronics Engineers, Inc.","short":"A. Akin, A.  Stephan ,  Laroque Christoph, in: C.  W. K. V, A. D’Ambrogio,  G Zacharewicz, N. Mustafee, G. Wainer, E. Page (Eds.), Proceedings of the 2017 Winter Simulation Conference (Accepted), Institute of Electrical and Electronics Engineers, Inc., n.d.","chicago":"Akin, Akbulut, Abke  Stephan , and  Laroque Christoph. “Automated Model Verification Using an Equivalence Test on a Reference Model.” In <i>Proceedings of the 2017 Winter Simulation Conference (Accepted)</i>, edited by Chan  W. K. V, A D’Ambrogio,  G Zacharewicz, N Mustafee, G Wainer, and E Page. Institute of Electrical and Electronics Engineers, Inc., n.d.","apa":"Akin, A.,  Stephan , A., &#38; Christoph,  Laroque. (n.d.). Automated Model Verification using an Equivalence Test on a Reference Model. In C.  W. K. V, A. D’Ambrogio,  G Zacharewicz, N. Mustafee, G. Wainer, &#38; E. Page (Eds.), <i>Proceedings of the 2017 Winter Simulation Conference (accepted)</i>. Institute of Electrical and Electronics Engineers, Inc."},"publication":"Proceedings of the 2017 Winter Simulation Conference (accepted)","publisher":"Institute of Electrical and Electronics Engineers, Inc.","user_id":"71124","publication_status":"accepted","language":[{"iso":"eng"}],"author":[{"last_name":"Akin","full_name":"Akin, Akbulut","first_name":"Akbulut"},{"full_name":" Stephan , Abke","last_name":" Stephan ","first_name":"Abke"},{"first_name":" Laroque","last_name":"Christoph","full_name":"Christoph,  Laroque"}],"status":"public","type":"conference","date_created":"2021-09-28T12:20:12Z","editor":[{"first_name":"Chan","last_name":" W. K. V","full_name":" W. K. V, Chan"},{"last_name":"D’Ambrogio","full_name":"D’Ambrogio, A","first_name":"A"},{"first_name":" G","full_name":"Zacharewicz,  G","last_name":"Zacharewicz"},{"last_name":"Mustafee","full_name":"Mustafee, N","first_name":"N"},{"first_name":"G","last_name":"Wainer","full_name":"Wainer, G"},{"full_name":"Page, E","last_name":"Page","first_name":"E"}],"date_updated":"2022-01-25T18:21:59Z"}