{"date_created":"2021-09-28T13:11:19Z","status":"public","type":"conference","citation":{"ieee":"A. Akbulut,  Stephan   Abke, and  Christoph  Laroque, “Automated Model Verification using an Equivalence Test on a Reference Mode,” in <i> Proceedings of the 2017 Winter Simulation Conference </i>.","short":"A. Akbulut,  Stephan   Abke,  Christoph  Laroque, in: W.K.V. Chan, A. D’Ambrogio, G. Zacharewicz, N. Mustafee, G. Wainer, E.  Page (Eds.),  Proceedings of the 2017 Winter Simulation Conference , Institute of Electrical and Electronics Engineers, Inc., n.d.","chicago":"Akbulut, Akin,  Stephan   Abke, and  Christoph  Laroque. “Automated Model Verification Using an Equivalence Test on a Reference Mode.” In <i> Proceedings of the 2017 Winter Simulation Conference </i>, edited by W. K. V Chan, A D’Ambrogio, G Zacharewicz, N Mustafee, G Wainer, and E  Page. Institute of Electrical and Electronics Engineers, Inc., n.d.","apa":"Akbulut, A.,  Abke,  Stephan , &#38;  Laroque,  Christoph. (n.d.). Automated Model Verification using an Equivalence Test on a Reference Mode. In W. K. V. Chan, A. D’Ambrogio, G. Zacharewicz, N. Mustafee, G. Wainer, &#38; E.  Page (Eds.), <i> Proceedings of the 2017 Winter Simulation Conference </i>. Institute of Electrical and Electronics Engineers, Inc.","bibtex":"@inproceedings{Akbulut_ Abke_ Laroque, title={Automated Model Verification using an Equivalence Test on a Reference Mode}, booktitle={ Proceedings of the 2017 Winter Simulation Conference }, publisher={Institute of Electrical and Electronics Engineers, Inc.}, author={Akbulut, Akin and  Abke,  Stephan  and  Laroque,  Christoph}, editor={Chan, W. K. V and D’Ambrogio, A and Zacharewicz, G and Mustafee, N and Wainer, G and  Page, E} }","mla":"Akbulut, Akin, et al. “Automated Model Verification Using an Equivalence Test on a Reference Mode.” <i> Proceedings of the 2017 Winter Simulation Conference </i>, edited by W. K. V Chan et al., Institute of Electrical and Electronics Engineers, Inc.","ama":"Akbulut A,  Abke  Stephan ,  Laroque  Christoph. Automated Model Verification using an Equivalence Test on a Reference Mode. In: Chan WKV, D’Ambrogio A, Zacharewicz G, Mustafee N, Wainer G,  Page E, eds. <i> Proceedings of the 2017 Winter Simulation Conference </i>. Institute of Electrical and Electronics Engineers, Inc."},"date_updated":"2022-01-06T06:56:50Z","publication":" Proceedings of the 2017 Winter Simulation Conference ","publisher":"Institute of Electrical and Electronics Engineers, Inc.","conference":{"start_date":"2017-12-03","end_date":"2017-12-06"},"_id":"25084","language":[{"iso":"eng"}],"title":"Automated Model Verification using an Equivalence Test on a Reference Mode","editor":[{"full_name":"Chan, W. K. V","last_name":"Chan","first_name":"W. K. V"},{"last_name":"D’Ambrogio","full_name":"D’Ambrogio, A","first_name":"A"},{"first_name":"G","last_name":"Zacharewicz","full_name":"Zacharewicz, G"},{"first_name":"N","last_name":"Mustafee","full_name":"Mustafee, N"},{"first_name":"G","full_name":"Wainer, G","last_name":"Wainer"},{"last_name":" Page","full_name":" Page, E","first_name":"E"}],"publication_status":"accepted","author":[{"last_name":"Akbulut","full_name":"Akbulut, Akin","first_name":"Akin"},{"first_name":" Stephan ","full_name":" Abke,  Stephan ","last_name":" Abke"},{"first_name":" Christoph","last_name":" Laroque","full_name":" Laroque,  Christoph"}],"department":[{"_id":"671"}],"year":"2017","user_id":"71124"}