--- _id: '25084' author: - first_name: Akin full_name: Akbulut, Akin last_name: Akbulut - first_name: ' Stephan ' full_name: ' Abke, Stephan ' last_name: ' Abke' - first_name: ' Christoph' full_name: ' Laroque, Christoph' last_name: ' Laroque' citation: ama: 'Akbulut A, Abke Stephan , Laroque Christoph. Automated Model Verification using an Equivalence Test on a Reference Mode. In: Chan WKV, D’Ambrogio A, Zacharewicz G, Mustafee N, Wainer G, Page E, eds. Proceedings of the 2017 Winter Simulation Conference . Institute of Electrical and Electronics Engineers, Inc.' apa: Akbulut, A., Abke, Stephan , & Laroque, Christoph. (n.d.). Automated Model Verification using an Equivalence Test on a Reference Mode. In W. K. V. Chan, A. D’Ambrogio, G. Zacharewicz, N. Mustafee, G. Wainer, & E. Page (Eds.), Proceedings of the 2017 Winter Simulation Conference . Institute of Electrical and Electronics Engineers, Inc. bibtex: '@inproceedings{Akbulut_ Abke_ Laroque, title={Automated Model Verification using an Equivalence Test on a Reference Mode}, booktitle={ Proceedings of the 2017 Winter Simulation Conference }, publisher={Institute of Electrical and Electronics Engineers, Inc.}, author={Akbulut, Akin and Abke, Stephan and Laroque, Christoph}, editor={Chan, W. K. V and D’Ambrogio, A and Zacharewicz, G and Mustafee, N and Wainer, G and Page, E} }' chicago: Akbulut, Akin, Stephan Abke, and Christoph Laroque. “Automated Model Verification Using an Equivalence Test on a Reference Mode.” In Proceedings of the 2017 Winter Simulation Conference , edited by W. K. V Chan, A D’Ambrogio, G Zacharewicz, N Mustafee, G Wainer, and E Page. Institute of Electrical and Electronics Engineers, Inc., n.d. ieee: A. Akbulut, Stephan Abke, and Christoph Laroque, “Automated Model Verification using an Equivalence Test on a Reference Mode,” in Proceedings of the 2017 Winter Simulation Conference . mla: Akbulut, Akin, et al. “Automated Model Verification Using an Equivalence Test on a Reference Mode.” Proceedings of the 2017 Winter Simulation Conference , edited by W. K. V Chan et al., Institute of Electrical and Electronics Engineers, Inc. short: 'A. Akbulut, Stephan Abke, Christoph Laroque, in: W.K.V. Chan, A. D’Ambrogio, G. Zacharewicz, N. Mustafee, G. Wainer, E. Page (Eds.), Proceedings of the 2017 Winter Simulation Conference , Institute of Electrical and Electronics Engineers, Inc., n.d.' conference: end_date: 2017-12-06 start_date: 2017-12-03 date_created: 2021-09-28T13:11:19Z date_updated: 2022-01-06T06:56:50Z department: - _id: '671' editor: - first_name: W. K. V full_name: Chan, W. K. V last_name: Chan - first_name: A full_name: D’Ambrogio, A last_name: D’Ambrogio - first_name: G full_name: Zacharewicz, G last_name: Zacharewicz - first_name: N full_name: Mustafee, N last_name: Mustafee - first_name: G full_name: Wainer, G last_name: Wainer - first_name: E full_name: ' Page, E' last_name: ' Page' language: - iso: eng publication: ' Proceedings of the 2017 Winter Simulation Conference ' publication_status: accepted publisher: Institute of Electrical and Electronics Engineers, Inc. status: public title: Automated Model Verification using an Equivalence Test on a Reference Mode type: conference user_id: '71124' year: '2017' ...