---
_id: '25084'
author:
- first_name: Akin
full_name: Akbulut, Akin
last_name: Akbulut
- first_name: ' Stephan '
full_name: ' Abke, Stephan '
last_name: ' Abke'
- first_name: ' Christoph'
full_name: ' Laroque, Christoph'
last_name: ' Laroque'
citation:
ama: 'Akbulut A, Abke Stephan , Laroque Christoph. Automated Model Verification
using an Equivalence Test on a Reference Mode. In: Chan WKV, D’Ambrogio A, Zacharewicz
G, Mustafee N, Wainer G, Page E, eds. Proceedings of the 2017 Winter Simulation
Conference . Institute of Electrical and Electronics Engineers, Inc.'
apa: Akbulut, A., Abke, Stephan , & Laroque, Christoph. (n.d.). Automated
Model Verification using an Equivalence Test on a Reference Mode. In W. K. V.
Chan, A. D’Ambrogio, G. Zacharewicz, N. Mustafee, G. Wainer, & E. Page (Eds.),
Proceedings of the 2017 Winter Simulation Conference . Institute of Electrical
and Electronics Engineers, Inc.
bibtex: '@inproceedings{Akbulut_ Abke_ Laroque, title={Automated Model Verification
using an Equivalence Test on a Reference Mode}, booktitle={ Proceedings of the
2017 Winter Simulation Conference }, publisher={Institute of Electrical and Electronics
Engineers, Inc.}, author={Akbulut, Akin and Abke, Stephan and Laroque, Christoph},
editor={Chan, W. K. V and D’Ambrogio, A and Zacharewicz, G and Mustafee, N and
Wainer, G and Page, E} }'
chicago: Akbulut, Akin, Stephan Abke, and Christoph Laroque. “Automated Model
Verification Using an Equivalence Test on a Reference Mode.” In Proceedings
of the 2017 Winter Simulation Conference , edited by W. K. V Chan, A D’Ambrogio,
G Zacharewicz, N Mustafee, G Wainer, and E Page. Institute of Electrical and
Electronics Engineers, Inc., n.d.
ieee: A. Akbulut, Stephan Abke, and Christoph Laroque, “Automated Model Verification
using an Equivalence Test on a Reference Mode,” in Proceedings of the 2017
Winter Simulation Conference .
mla: Akbulut, Akin, et al. “Automated Model Verification Using an Equivalence Test
on a Reference Mode.” Proceedings of the 2017 Winter Simulation Conference
, edited by W. K. V Chan et al., Institute of Electrical and Electronics Engineers,
Inc.
short: 'A. Akbulut, Stephan Abke, Christoph Laroque, in: W.K.V. Chan, A. D’Ambrogio,
G. Zacharewicz, N. Mustafee, G. Wainer, E. Page (Eds.), Proceedings of the 2017
Winter Simulation Conference , Institute of Electrical and Electronics Engineers,
Inc., n.d.'
conference:
end_date: 2017-12-06
start_date: 2017-12-03
date_created: 2021-09-28T13:11:19Z
date_updated: 2022-01-06T06:56:50Z
department:
- _id: '671'
editor:
- first_name: W. K. V
full_name: Chan, W. K. V
last_name: Chan
- first_name: A
full_name: D’Ambrogio, A
last_name: D’Ambrogio
- first_name: G
full_name: Zacharewicz, G
last_name: Zacharewicz
- first_name: N
full_name: Mustafee, N
last_name: Mustafee
- first_name: G
full_name: Wainer, G
last_name: Wainer
- first_name: E
full_name: ' Page, E'
last_name: ' Page'
language:
- iso: eng
publication: ' Proceedings of the 2017 Winter Simulation Conference '
publication_status: accepted
publisher: Institute of Electrical and Electronics Engineers, Inc.
status: public
title: Automated Model Verification using an Equivalence Test on a Reference Mode
type: conference
user_id: '71124'
year: '2017'
...