{"author":[{"first_name":"Markus","full_name":"Becker, Markus","last_name":"Becker"},{"first_name":"Christoph","last_name":"Kuznik","full_name":"Kuznik, Christoph"},{"first_name":"M. tech. Mabel Mary","full_name":"Joy, M. tech. Mabel Mary","last_name":"Joy"},{"first_name":"Tao","full_name":"Xie, Tao","last_name":"Xie"},{"full_name":"Müller, Wolfgang","last_name":"Müller","id":"16243","first_name":"Wolfgang"}],"status":"public","year":"2012","citation":{"bibtex":"@inproceedings{Becker_Kuznik_Joy_Xie_Müller_2012, title={Binary Mutation Testing Through Dynamic Translation}, booktitle={ 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)}, author={Becker, Markus and Kuznik, Christoph and Joy, M. tech. Mabel Mary and Xie, Tao and Müller, Wolfgang}, year={2012} }","short":"M. Becker, C. Kuznik, M. tech. M.M. Joy, T. Xie, W. Müller, in:  42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2012.","chicago":"Becker, Markus, Christoph Kuznik, M. tech. Mabel Mary Joy, Tao Xie, and Wolfgang Müller. “Binary Mutation Testing Through Dynamic Translation.” In <i> 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)</i>, 2012.","mla":"Becker, Markus, et al. “Binary Mutation Testing Through Dynamic Translation.” <i> 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)</i>, 2012.","ama":"Becker M, Kuznik C, Joy M tech. MM, Xie T, Müller W. Binary Mutation Testing Through Dynamic Translation. In: <i> 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)</i>. ; 2012.","ieee":"M. Becker, C. Kuznik, M. tech. M. M. Joy, T. Xie, and W. Müller, “Binary Mutation Testing Through Dynamic Translation,” 2012.","apa":"Becker, M., Kuznik, C., Joy, M. tech. M. M., Xie, T., &#38; Müller, W. (2012). Binary Mutation Testing Through Dynamic Translation. <i> 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)</i>."},"user_id":"21240","date_created":"2021-10-11T08:39:53Z","department":[{"_id":"672"}],"title":"Binary Mutation Testing Through Dynamic Translation","_id":"26022","language":[{"iso":"eng"}],"main_file_link":[{"url":"http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6263914&isnumber=6263904"}],"publication":" 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","type":"conference","date_updated":"2022-01-06T06:57:15Z"}