{"status":"public","author":[{"full_name":"Becker, Markus","last_name":"Becker","first_name":"Markus"},{"first_name":"Christoph","last_name":"Kuznik","full_name":"Kuznik, Christoph"},{"full_name":"Joy, M. tech. Mabel","first_name":"M. tech. Mabel","last_name":"Joy"},{"first_name":"Tao","last_name":"Xie","full_name":"Xie, Tao"},{"full_name":"Müller, Wolfgang","last_name":"Müller","first_name":"Wolfgang","id":"16243"}],"date_updated":"2022-01-06T06:57:16Z","title":"XEMU: A QEMU Based Binary Mutation Testing Framework","type":"conference","user_id":"21240","year":"2012","place":"University Booth, Dresden","_id":"26080","language":[{"iso":"eng"}],"citation":{"bibtex":"@inproceedings{Becker_Kuznik_Joy_Xie_Müller_2012, place={University Booth, Dresden}, title={XEMU: A QEMU Based Binary Mutation Testing Framework}, booktitle={Design, Automation and Test in Europe DATE}, author={Becker, Markus and Kuznik, Christoph and Joy, M. tech. Mabel and Xie, Tao and Müller, Wolfgang}, year={2012} }","apa":"Becker, M., Kuznik, C., Joy, M. tech. M., Xie, T., & Müller, W. (2012). XEMU: A QEMU Based Binary Mutation Testing Framework. Design, Automation and Test in Europe DATE.","ama":"Becker M, Kuznik C, Joy M tech. M, Xie T, Müller W. XEMU: A QEMU Based Binary Mutation Testing Framework. In: Design, Automation and Test in Europe DATE. ; 2012.","chicago":"Becker, Markus, Christoph Kuznik, M. tech. Mabel Joy, Tao Xie, and Wolfgang Müller. “XEMU: A QEMU Based Binary Mutation Testing Framework.” In Design, Automation and Test in Europe DATE. University Booth, Dresden, 2012.","mla":"Becker, Markus, et al. “XEMU: A QEMU Based Binary Mutation Testing Framework.” Design, Automation and Test in Europe DATE, 2012.","short":"M. Becker, C. Kuznik, M. tech. M. Joy, T. Xie, W. Müller, in: Design, Automation and Test in Europe DATE, University Booth, Dresden, 2012.","ieee":"M. Becker, C. Kuznik, M. tech. M. Joy, T. Xie, and W. Müller, “XEMU: A QEMU Based Binary Mutation Testing Framework,” 2012."},"date_created":"2021-10-12T10:57:15Z","publication":"Design, Automation and Test in Europe DATE","department":[{"_id":"672"}]}