{"conference":{"start_date":"2013-08-04","end_date":"2013-08-07"},"year":"2013","date_updated":"2022-01-06T06:58:08Z","_id":"28523","type":"conference","title":"Virtual Test Environment for Self-Optimizing Systems","series_title":"ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013)","author":[{"full_name":"St{\\\"o}cklein, J{\\\"o}rg ","first_name":"J{\\\"o}rg ","last_name":"St{\\\"o}cklein"},{"last_name":"M{\\\"u}ller","first_name":"Wolfgang","full_name":"M{\\\"u}ller, Wolfgang"},{"full_name":"Baldin, Daniel","last_name":"Baldin","first_name":"Daniel"},{"full_name":"Xie,  Tao","first_name":" Tao","last_name":"Xie"}],"citation":{"ama":"St{\\\"o}cklein J, M{\\\"u}ller W, Baldin D, Xie  Tao. Virtual Test Environment for Self-Optimizing Systems. Published online 2013.","ieee":"J. St{\\\"o}cklein, W. M{\\\"u}ller, D. Baldin, and  Tao Xie, “Virtual Test Environment for Self-Optimizing Systems.” ASME, 2013.","mla":"St{\\\"o}cklein, J{\\\"o}rg, et al. <i>Virtual Test Environment for Self-Optimizing Systems</i>. ASME, 2013.","bibtex":"@article{St{\\\"o}cklein_M{\\\"u}ller_Baldin_Xie_2013, series={ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013)}, title={Virtual Test Environment for Self-Optimizing Systems}, publisher={ASME}, author={St{\\\"o}cklein, J{\\\"o}rg  and M{\\\"u}ller, Wolfgang and Baldin, Daniel and Xie,  Tao}, year={2013}, collection={ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013)} }","short":"J. St{\\\"o}cklein, W. M{\\\"u}ller, D. Baldin,  Tao Xie, (2013).","apa":"St{\\\"o}cklein, J., M{\\\"u}ller, W., Baldin, D., &#38; Xie,  Tao. (2013). <i>Virtual Test Environment for Self-Optimizing Systems</i>. ASME.","chicago":"St{\\\"o}cklein, J{\\\"o}rg , Wolfgang M{\\\"u}ller, Daniel Baldin, and  Tao Xie. “Virtual Test Environment for Self-Optimizing Systems.” ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA2013). ASME, 2013."},"status":"public","date_created":"2021-12-09T06:18:26Z","publication_status":"published","department":[{"_id":"676"}],"language":[{"iso":"eng"}],"publisher":"ASME","user_id":"71124"}