{"editor":[{"last_name":"Ali","full_name":"Ali, Moonis ","first_name":"Moonis "},{"first_name":"Young Sig","last_name":"Kwon","full_name":"Kwon, Young Sig"},{"last_name":"Lee","full_name":"Lee, Chang-Hwan","first_name":"Chang-Hwan"},{"first_name":"Juntae ","last_name":"Kim","full_name":"Kim, Juntae "},{"last_name":"Kim","full_name":"Kim, Yongdai ","first_name":"Yongdai "}],"date_created":"2017-10-17T12:41:49Z","file_date_updated":"2018-03-21T09:21:30Z","quality_controlled":"1","abstract":[{"text":"Opinion mining from physician rating websites depends on the quality of the extracted information. Sometimes reviews are user-error prone and the assigned stars or grades contradict the associated content. We therefore aim at detecting random individual error within reviews. Such errors comprise the disagreement in polarity of review texts and the respective ratings. The challenges that thereby arise are (1) the content and sentiment analysis of the review texts and (2) the removal of the random individual errors contained therein. To solve these tasks, we assign polarities to automatically recognized opinion phrases in reviews and then check for divergence in rating and text polarity. The novelty of our approach is that we improve user-generated data quality by excluding error-prone reviews on German physician websites from average ratings.","lang":"eng"}],"has_accepted_license":"1","project":[{"name":"SFB 901","_id":"1"},{"name":"SFB 901 - Project Area B","_id":"3"},{"name":"SFB 901 - Subproject B1","_id":"9"}],"file":[{"file_name":"293-IEA_AIE2015.pdf","file_id":"1463","success":1,"file_size":292847,"creator":"florida","date_created":"2018-03-21T09:21:30Z","date_updated":"2018-03-21T09:21:30Z","relation":"main_file","content_type":"application/pdf","access_level":"closed"}],"page":"305-315","doi":"10.1007/978-3-319-19066-2_30","publication_status":"published","ddc":["040"],"citation":{"short":"M. Geierhos, F.S. Bäumer, S. Schulze, V. Stuß, in: M. Ali, Y.S. Kwon, C.-H. Lee, J. Kim, Y. Kim (Eds.), Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015), Springer, Cham, Switzerland, 2015, pp. 305–315.","chicago":"Geierhos, Michaela, Frederik Simon Bäumer, Sabine Schulze, and Valentina Stuß. “Filtering Reviews by Random Individual Error.” In <i>Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)</i>, edited by Moonis  Ali, Young Sig Kwon, Chang-Hwan Lee, Juntae  Kim, and Yongdai  Kim, 9101:305–15. Lecture Notes in Artificial Intelligence. Cham, Switzerland: Springer, 2015. <a href=\"https://doi.org/10.1007/978-3-319-19066-2_30\">https://doi.org/10.1007/978-3-319-19066-2_30</a>.","bibtex":"@inbook{Geierhos_Bäumer_Schulze_Stuß_2015, place={Cham, Switzerland}, series={Lecture Notes in Artificial Intelligence}, title={Filtering Reviews by Random Individual Error}, volume={9101}, DOI={<a href=\"https://doi.org/10.1007/978-3-319-19066-2_30\">10.1007/978-3-319-19066-2_30</a>}, booktitle={Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)}, publisher={Springer}, author={Geierhos, Michaela and Bäumer, Frederik Simon and Schulze, Sabine and Stuß, Valentina}, editor={Ali, Moonis  and Kwon, Young Sig and Lee, Chang-Hwan and Kim, Juntae  and Kim, Yongdai Editors}, year={2015}, pages={305–315}, collection={Lecture Notes in Artificial Intelligence} }","apa":"Geierhos, M., Bäumer, F. S., Schulze, S., &#38; Stuß, V. (2015). Filtering Reviews by Random Individual Error. In M. Ali, Y. S. Kwon, C.-H. Lee, J. Kim, &#38; Y. Kim (Eds.), <i>Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)</i> (Vol. 9101, pp. 305–315). Cham, Switzerland: Springer. <a href=\"https://doi.org/10.1007/978-3-319-19066-2_30\">https://doi.org/10.1007/978-3-319-19066-2_30</a>","ieee":"M. Geierhos, F. S. Bäumer, S. Schulze, and V. Stuß, “Filtering Reviews by Random Individual Error,” in <i>Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)</i>, vol. 9101, M. Ali, Y. S. Kwon, C.-H. Lee, J. Kim, and Y. Kim, Eds. Cham, Switzerland: Springer, 2015, pp. 305–315.","ama":"Geierhos M, Bäumer FS, Schulze S, Stuß V. Filtering Reviews by Random Individual Error. In: Ali M, Kwon YS, Lee C-H, Kim J, Kim Y, eds. <i>Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)</i>. Vol 9101. Lecture Notes in Artificial Intelligence. Cham, Switzerland: Springer; 2015:305-315. doi:<a href=\"https://doi.org/10.1007/978-3-319-19066-2_30\">10.1007/978-3-319-19066-2_30</a>","mla":"Geierhos, Michaela, et al. “Filtering Reviews by Random Individual Error.” <i>Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)</i>, edited by Moonis  Ali et al., vol. 9101, Springer, 2015, pp. 305–15, doi:<a href=\"https://doi.org/10.1007/978-3-319-19066-2_30\">10.1007/978-3-319-19066-2_30</a>."},"user_id":"42496","department":[{"_id":"36"},{"_id":"1"},{"_id":"579"}],"publication_identifier":{"eisbn":["978-3-319-19066-2"],"isbn":["978-3-319-19065-5"]},"_id":"293","title":"Filtering Reviews by Random Individual Error","volume":9101,"publisher":"Springer","author":[{"last_name":"Geierhos","id":"42496","full_name":"Geierhos, Michaela","orcid":"0000-0002-8180-5606","first_name":"Michaela"},{"id":"38837","last_name":"Bäumer","full_name":"Bäumer, Frederik Simon","first_name":"Frederik Simon"},{"last_name":"Schulze","full_name":"Schulze, Sabine","first_name":"Sabine"},{"last_name":"Stuß","full_name":"Stuß, Valentina","first_name":"Valentina"}],"intvolume":"      9101","status":"public","place":"Cham, Switzerland","year":"2015","publication":"Proceedings of the 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)","conference":{"name":"28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems (IEA/AIE 2015)","location":"Seoul, South Korea","end_date":"2015-06-12","start_date":"2015-06-10"},"date_updated":"2022-01-06T06:58:47Z","type":"book_chapter","series_title":"Lecture Notes in Artificial Intelligence","language":[{"iso":"eng"}]}