---
res:
  bibo_abstract:
  - Time-variant age information of different parts of a system can be used for system-level
    performance improvement through high-level task scheduling, thus extending the
    life-time of the system. Progressive age information should provide the age state
    that the system is in, and the rate that it is being aged at. In this paper, we
    propose a structure that monitors certain paths of a circuit and detects its gradual
    age growth, and provides the aging rate and aging state of the circuit. The proposed
    monitors are placed on a selected set of nodes that represent a timing bottleneck
    of the system. These monitors sample expected data on these nodes, and compare
    them with the expected values. The timing of sampling changes as the circuit ages
    and its delay increases. The timing of sampling will provide a measure of aging
    advancement of a circuit. To assess the efficacy of the proposed method and compare
    it with other state-of-the-art aging monitors, we use them on selected nodes of
    the execution unit of different processors, as well as some circuits from ITC99
    benchmarks. The results reveal that the precision of our proposed method is between
    0.12 (ns) to 0.401 (ns). Its Area and power overhead are negligible and are about
    2.13 and 0.69 percent respectively.@eng
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Somayeh
      foaf_name: Sadeghi-Kohan, Somayeh
      foaf_surname: Sadeghi-Kohan
      foaf_workInfoHomepage: http://www.librecat.org/personId=78614
    orcid: https://orcid.org/0000-0001-7246-0610
  - foaf_Person:
      foaf_givenName: Mehdi
      foaf_name: Kamal, Mehdi
      foaf_surname: Kamal
  - foaf_Person:
      foaf_givenName: Zainalabedin
      foaf_name: Navabi, Zainalabedin
      foaf_surname: Navabi
  bibo_doi: 10.1109/tetc.2017.2771441
  bibo_issue: '3'
  bibo_volume: 8
  dct_date: 2017^xs_gYear
  dct_isPartOf:
  - http://id.crossref.org/issn/2168-6750
  - http://id.crossref.org/issn/2376-4562
  dct_language: eng
  dct_publisher: Institute of Electrical and Electronics Engineers (IEEE)@
  dct_subject:
  - Age advancement
  - age monitoring clock
  - aging rate
  - self-adjusting monitors
  dct_title: Self-Adjusting Monitor for Measuring Aging Rate and Advancement@
...