{"department":[{"_id":"48"}],"citation":{"ama":"Jenihhin M, Kamkin A, Navabi Z, Sadeghi-Kohan S. Universal mitigation of NBTI-induced aging by design randomization. In: <i>2016 IEEE East-West Design &#38; Test Symposium (EWDTS)</i>. IEEE; 2017. doi:<a href=\"https://doi.org/10.1109/ewdts.2016.7807635\">10.1109/ewdts.2016.7807635</a>","bibtex":"@inproceedings{Jenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title={Universal mitigation of NBTI-induced aging by design randomization}, DOI={<a href=\"https://doi.org/10.1109/ewdts.2016.7807635\">10.1109/ewdts.2016.7807635</a>}, booktitle={2016 IEEE East-West Design &#38; Test Symposium (EWDTS)}, publisher={IEEE}, author={Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh}, year={2017} }","ieee":"M. Jenihhin, A. Kamkin, Z. Navabi, and S. Sadeghi-Kohan, “Universal mitigation of NBTI-induced aging by design randomization,” 2017, doi: <a href=\"https://doi.org/10.1109/ewdts.2016.7807635\">10.1109/ewdts.2016.7807635</a>.","short":"M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design &#38; Test Symposium (EWDTS), IEEE, 2017.","apa":"Jenihhin, M., Kamkin, A., Navabi, Z., &#38; Sadeghi-Kohan, S. (2017). Universal mitigation of NBTI-induced aging by design randomization. <i>2016 IEEE East-West Design &#38; Test Symposium (EWDTS)</i>. <a href=\"https://doi.org/10.1109/ewdts.2016.7807635\">https://doi.org/10.1109/ewdts.2016.7807635</a>","mla":"Jenihhin, Maksim, et al. “Universal Mitigation of NBTI-Induced Aging by Design Randomization.” <i>2016 IEEE East-West Design &#38; Test Symposium (EWDTS)</i>, IEEE, 2017, doi:<a href=\"https://doi.org/10.1109/ewdts.2016.7807635\">10.1109/ewdts.2016.7807635</a>.","chicago":"Jenihhin, Maksim, Alexander Kamkin, Zainalabedin Navabi, and Somayeh Sadeghi-Kohan. “Universal Mitigation of NBTI-Induced Aging by Design Randomization.” In <i>2016 IEEE East-West Design &#38; Test Symposium (EWDTS)</i>. IEEE, 2017. <a href=\"https://doi.org/10.1109/ewdts.2016.7807635\">https://doi.org/10.1109/ewdts.2016.7807635</a>."},"type":"conference","publisher":"IEEE","user_id":"78614","year":"2017","author":[{"first_name":"Maksim","full_name":"Jenihhin, Maksim","last_name":"Jenihhin"},{"first_name":"Alexander","last_name":"Kamkin","full_name":"Kamkin, Alexander"},{"full_name":"Navabi, Zainalabedin","last_name":"Navabi","first_name":"Zainalabedin"},{"orcid":"https://orcid.org/0000-0001-7246-0610","id":"78614","first_name":"Somayeh","last_name":"Sadeghi-Kohan","full_name":"Sadeghi-Kohan, Somayeh"}],"status":"public","_id":"29463","publication_status":"published","date_created":"2022-01-19T13:50:13Z","doi":"10.1109/ewdts.2016.7807635","abstract":[{"lang":"eng","text":"In this paper we propose to think out of the box and discuss an approach for universal mitigation of Negative Bias Temperature Instability (NBTI) induced aging untied from the limitations of its modelling. The cost-effective approach exploits a simple property of a randomized design, i.e., the equalized signal probability and switching activity at gate inputs. The techniques considered for structural design randomization involve both the hardware architecture and embedded software layers. Ultimately, the proposed approach aims at extending the reliable lifetime of nanoelectronic systems."}],"extern":"1","publication":"2016 IEEE East-West Design & Test Symposium (EWDTS)","title":"Universal mitigation of NBTI-induced aging by design randomization","date_updated":"2023-08-02T11:36:43Z","language":[{"iso":"eng"}]}