{"user_id":"26883","title":"Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias","author":[{"full_name":"Höink, V.","last_name":"Höink","first_name":"V."},{"full_name":"Sacher, Marc","orcid":"0000-0001-6217-336X","id":"26883","last_name":"Sacher","first_name":"Marc"},{"first_name":"J.","last_name":"Schmalhorst","full_name":"Schmalhorst, J."},{"full_name":"Reiss, G.","first_name":"G.","last_name":"Reiss"},{"last_name":"Engel","first_name":"D.","full_name":"Engel, D."},{"last_name":"Junk","first_name":"D.","full_name":"Junk, D."},{"first_name":"A.","last_name":"Ehresmann","full_name":"Ehresmann, A."}],"status":"public","publisher":"AIP Publishing","article_number":"152102","volume":86,"publication_status":"published","type":"journal_article","date_updated":"2024-04-23T12:15:06Z","intvolume":" 86","publication":"Applied Physics Letters","date_created":"2022-01-31T10:21:57Z","citation":{"apa":"Höink, V., Sacher, M., Schmalhorst, J., Reiss, G., Engel, D., Junk, D., & Ehresmann, A. (2005). Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias. Applied Physics Letters, 86(15), Article 152102. https://doi.org/10.1063/1.1899771","ama":"Höink V, Sacher M, Schmalhorst J, et al. Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias. Applied Physics Letters. 2005;86(15). doi:10.1063/1.1899771","bibtex":"@article{Höink_Sacher_Schmalhorst_Reiss_Engel_Junk_Ehresmann_2005, title={Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias}, volume={86}, DOI={10.1063/1.1899771}, number={15152102}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Höink, V. and Sacher, Marc and Schmalhorst, J. and Reiss, G. and Engel, D. and Junk, D. and Ehresmann, A.}, year={2005} }","short":"V. Höink, M. Sacher, J. Schmalhorst, G. Reiss, D. Engel, D. Junk, A. Ehresmann, Applied Physics Letters 86 (2005).","ieee":"V. Höink et al., “Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias,” Applied Physics Letters, vol. 86, no. 15, Art. no. 152102, 2005, doi: 10.1063/1.1899771.","chicago":"Höink, V., Marc Sacher, J. Schmalhorst, G. Reiss, D. Engel, D. Junk, and A. Ehresmann. “Postannealing of Magnetic Tunnel Junctions with Ion-Bombardment-Modified Exchange Bias.” Applied Physics Letters 86, no. 15 (2005). https://doi.org/10.1063/1.1899771.","mla":"Höink, V., et al. “Postannealing of Magnetic Tunnel Junctions with Ion-Bombardment-Modified Exchange Bias.” Applied Physics Letters, vol. 86, no. 15, 152102, AIP Publishing, 2005, doi:10.1063/1.1899771."},"language":[{"iso":"eng"}],"publication_identifier":{"issn":["0003-6951","1077-3118"]},"_id":"29691","year":"2005","department":[{"_id":"15"}],"keyword":["Physics and Astronomy (miscellaneous)"],"doi":"10.1063/1.1899771","extern":"1","issue":"15"}