{"extern":"1","language":[{"iso":"eng"}],"author":[{"last_name":"Höink","full_name":"Höink, V.","first_name":"V."},{"first_name":"Marc","last_name":"Sacher","full_name":"Sacher, Marc","id":"26883"},{"first_name":"J.","full_name":"Schmalhorst, J.","last_name":"Schmalhorst"},{"first_name":"G.","full_name":"Reiss, G.","last_name":"Reiss"},{"first_name":"D.","last_name":"Engel","full_name":"Engel, D."},{"last_name":"Junk","full_name":"Junk, D.","first_name":"D."},{"first_name":"A.","full_name":"Ehresmann, A.","last_name":"Ehresmann"}],"intvolume":"        86","date_updated":"2022-01-31T10:22:19Z","user_id":"26883","issue":"15","publication":"Applied Physics Letters","keyword":["Physics and Astronomy (miscellaneous)"],"volume":86,"type":"journal_article","_id":"29691","status":"public","date_created":"2022-01-31T10:21:57Z","publication_identifier":{"issn":["0003-6951","1077-3118"]},"title":"Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias","citation":{"short":"V. Höink, M. Sacher, J. Schmalhorst, G. Reiss, D. Engel, D. Junk, A. Ehresmann, Applied Physics Letters 86 (2005).","bibtex":"@article{Höink_Sacher_Schmalhorst_Reiss_Engel_Junk_Ehresmann_2005, title={Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias}, volume={86}, DOI={<a href=\"https://doi.org/10.1063/1.1899771\">10.1063/1.1899771</a>}, number={15152102}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Höink, V. and Sacher, Marc and Schmalhorst, J. and Reiss, G. and Engel, D. and Junk, D. and Ehresmann, A.}, year={2005} }","ieee":"V. Höink <i>et al.</i>, “Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias,” <i>Applied Physics Letters</i>, vol. 86, no. 15, Art. no. 152102, 2005, doi: <a href=\"https://doi.org/10.1063/1.1899771\">10.1063/1.1899771</a>.","ama":"Höink V, Sacher M, Schmalhorst J, et al. Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias. <i>Applied Physics Letters</i>. 2005;86(15). doi:<a href=\"https://doi.org/10.1063/1.1899771\">10.1063/1.1899771</a>","mla":"Höink, V., et al. “Postannealing of Magnetic Tunnel Junctions with Ion-Bombardment-Modified Exchange Bias.” <i>Applied Physics Letters</i>, vol. 86, no. 15, 152102, AIP Publishing, 2005, doi:<a href=\"https://doi.org/10.1063/1.1899771\">10.1063/1.1899771</a>.","apa":"Höink, V., Sacher, M., Schmalhorst, J., Reiss, G., Engel, D., Junk, D., &#38; Ehresmann, A. (2005). Postannealing of magnetic tunnel junctions with ion-bombardment-modified exchange bias. <i>Applied Physics Letters</i>, <i>86</i>(15), Article 152102. <a href=\"https://doi.org/10.1063/1.1899771\">https://doi.org/10.1063/1.1899771</a>","chicago":"Höink, V., Marc Sacher, J. Schmalhorst, G. Reiss, D. Engel, D. Junk, and A. Ehresmann. “Postannealing of Magnetic Tunnel Junctions with Ion-Bombardment-Modified Exchange Bias.” <i>Applied Physics Letters</i> 86, no. 15 (2005). <a href=\"https://doi.org/10.1063/1.1899771\">https://doi.org/10.1063/1.1899771</a>."},"article_number":"152102","department":[{"_id":"15"},{"_id":"576"}],"doi":"10.1063/1.1899771","publisher":"AIP Publishing","publication_status":"published","year":"2005"}