{"date_updated":"2022-03-25T12:04:48Z","language":[{"iso":"eng"}],"publication":"IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2)","title":"Modeling and Control Design for a Very Low-Frequency High-Voltage Test System","user_id":"71353","year":"2010","author":[{"last_name":"Cao","full_name":"Cao, Z.","first_name":"Z."},{"full_name":"Hu, M.","last_name":"Hu","first_name":"M."},{"first_name":"N.","last_name":"Fröhleke","full_name":"Fröhleke, N."},{"id":"66","first_name":"Joachim","full_name":"Böcker, Joachim","last_name":"Böcker","orcid":"0000-0002-8480-7295"}],"status":"public","_id":"30521","date_created":"2022-03-25T11:32:48Z","doi":"10.1109/TPEL.2009.2033600","department":[{"_id":"52"}],"citation":{"ama":"Cao Z, Hu M, Fröhleke N, Böcker J. Modeling and Control Design for a Very Low-Frequency High-Voltage Test System. In: <i>IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2)</i>. ; 2010. doi:<a href=\"https://doi.org/10.1109/TPEL.2009.2033600\">10.1109/TPEL.2009.2033600</a>","ieee":"Z. Cao, M. Hu, N. Fröhleke, and J. Böcker, “Modeling and Control Design for a Very Low-Frequency High-Voltage Test System,” 2010, doi: <a href=\"https://doi.org/10.1109/TPEL.2009.2033600\">10.1109/TPEL.2009.2033600</a>.","bibtex":"@inproceedings{Cao_Hu_Fröhleke_Böcker_2010, title={Modeling and Control Design for a Very Low-Frequency High-Voltage Test System}, DOI={<a href=\"https://doi.org/10.1109/TPEL.2009.2033600\">10.1109/TPEL.2009.2033600</a>}, booktitle={IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2)}, author={Cao, Z. and Hu, M. and Fröhleke, N. and Böcker, Joachim}, year={2010} }","short":"Z. Cao, M. Hu, N. Fröhleke, J. Böcker, in: IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2), 2010.","apa":"Cao, Z., Hu, M., Fröhleke, N., &#38; Böcker, J. (2010). Modeling and Control Design for a Very Low-Frequency High-Voltage Test System. <i>IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2)</i>. <a href=\"https://doi.org/10.1109/TPEL.2009.2033600\">https://doi.org/10.1109/TPEL.2009.2033600</a>","chicago":"Cao, Z., M. Hu, N. Fröhleke, and Joachim Böcker. “Modeling and Control Design for a Very Low-Frequency High-Voltage Test System.” In <i>IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2)</i>, 2010. <a href=\"https://doi.org/10.1109/TPEL.2009.2033600\">https://doi.org/10.1109/TPEL.2009.2033600</a>.","mla":"Cao, Z., et al. “Modeling and Control Design for a Very Low-Frequency High-Voltage Test System.” <i>IEEE TRANSACTIONS ON POWER ELECTRONICS 25(2)</i>, 2010, doi:<a href=\"https://doi.org/10.1109/TPEL.2009.2033600\">10.1109/TPEL.2009.2033600</a>."},"type":"conference"}