{"language":[{"iso":"eng"}],"publication_status":"published","doi":"10.1109/tse.2021.3101739","page":"1-1","publication":"IEEE Transactions on Software Engineering","type":"journal_article","date_updated":"2022-05-09T13:03:18Z","status":"public","year":"2021","author":[{"first_name":"Andreas Peter","full_name":"Dann, Andreas Peter","last_name":"Dann","id":"26886"},{"full_name":"Plate, Henrik","last_name":"Plate","first_name":"Henrik"},{"orcid":"0000-0001-9848-2017","first_name":"Ben","id":"66173","last_name":"Hermann","full_name":"Hermann, Ben"},{"last_name":"Ponta","full_name":"Ponta, Serena Elisa","first_name":"Serena Elisa"},{"last_name":"Bodden","id":"59256","full_name":"Bodden, Eric","orcid":"0000-0003-3470-3647","first_name":"Eric"}],"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","department":[{"_id":"76"}],"publication_identifier":{"issn":["0098-5589","1939-3520","2326-3881"]},"title":"Identifying Challenges for OSS Vulnerability Scanners - A Study &amp; Test Suite","_id":"31132","keyword":["Software"],"citation":{"apa":"Dann, A. P., Plate, H., Hermann, B., Ponta, S. E., &#38; Bodden, E. (2021). Identifying Challenges for OSS Vulnerability Scanners - A Study &#38;amp; Test Suite. <i>IEEE Transactions on Software Engineering</i>, 1–1. <a href=\"https://doi.org/10.1109/tse.2021.3101739\">https://doi.org/10.1109/tse.2021.3101739</a>","short":"A.P. Dann, H. Plate, B. Hermann, S.E. Ponta, E. Bodden, IEEE Transactions on Software Engineering (2021) 1–1.","chicago":"Dann, Andreas Peter, Henrik Plate, Ben Hermann, Serena Elisa Ponta, and Eric Bodden. “Identifying Challenges for OSS Vulnerability Scanners - A Study &#38;amp; Test Suite.” <i>IEEE Transactions on Software Engineering</i>, 2021, 1–1. <a href=\"https://doi.org/10.1109/tse.2021.3101739\">https://doi.org/10.1109/tse.2021.3101739</a>.","ieee":"A. P. Dann, H. Plate, B. Hermann, S. E. Ponta, and E. Bodden, “Identifying Challenges for OSS Vulnerability Scanners - A Study &#38;amp; Test Suite,” <i>IEEE Transactions on Software Engineering</i>, pp. 1–1, 2021, doi: <a href=\"https://doi.org/10.1109/tse.2021.3101739\">10.1109/tse.2021.3101739</a>.","ama":"Dann AP, Plate H, Hermann B, Ponta SE, Bodden E. Identifying Challenges for OSS Vulnerability Scanners - A Study &#38;amp; Test Suite. <i>IEEE Transactions on Software Engineering</i>. Published online 2021:1-1. doi:<a href=\"https://doi.org/10.1109/tse.2021.3101739\">10.1109/tse.2021.3101739</a>","bibtex":"@article{Dann_Plate_Hermann_Ponta_Bodden_2021, title={Identifying Challenges for OSS Vulnerability Scanners - A Study &#38;amp; Test Suite}, DOI={<a href=\"https://doi.org/10.1109/tse.2021.3101739\">10.1109/tse.2021.3101739</a>}, journal={IEEE Transactions on Software Engineering}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Dann, Andreas Peter and Plate, Henrik and Hermann, Ben and Ponta, Serena Elisa and Bodden, Eric}, year={2021}, pages={1–1} }","mla":"Dann, Andreas Peter, et al. “Identifying Challenges for OSS Vulnerability Scanners - A Study &#38;amp; Test Suite.” <i>IEEE Transactions on Software Engineering</i>, Institute of Electrical and Electronics Engineers (IEEE), 2021, pp. 1–1, doi:<a href=\"https://doi.org/10.1109/tse.2021.3101739\">10.1109/tse.2021.3101739</a>."},"user_id":"15249","date_created":"2022-05-09T13:02:35Z"}