{"issue":"2","publication":"Electr. Notes Theor. Comput. Sci.","type":"journal_article","date_updated":"2022-01-06T06:59:04Z","page":"135--151","doi":"10.1016/j.entcs.2009.08.022","author":[{"id":"573","last_name":"Wehrheim","full_name":"Wehrheim, Heike","first_name":"Heike"},{"full_name":"Wonisch, Daniel","last_name":"Wonisch","first_name":"Daniel"}],"year":"2009","status":"public","date_created":"2018-06-13T09:24:52Z","citation":{"mla":"Wehrheim, Heike, and Daniel Wonisch. “Compositional {CSP} Traces Refinement Checking.” Electr. Notes Theor. Comput. Sci., no. 2, 2009, pp. 135--151, doi:10.1016/j.entcs.2009.08.022.","bibtex":"@article{Wehrheim_Wonisch_2009, title={Compositional {CSP} Traces Refinement Checking}, DOI={10.1016/j.entcs.2009.08.022}, number={2}, journal={Electr. Notes Theor. Comput. Sci.}, author={Wehrheim, Heike and Wonisch, Daniel}, year={2009}, pages={135--151} }","ama":"Wehrheim H, Wonisch D. Compositional {CSP} Traces Refinement Checking. Electr Notes Theor Comput Sci. 2009;(2):135--151. doi:10.1016/j.entcs.2009.08.022","ieee":"H. Wehrheim and D. Wonisch, “Compositional {CSP} Traces Refinement Checking,” Electr. Notes Theor. Comput. Sci., no. 2, pp. 135--151, 2009.","short":"H. Wehrheim, D. Wonisch, Electr. Notes Theor. Comput. Sci. (2009) 135--151.","apa":"Wehrheim, H., & Wonisch, D. (2009). Compositional {CSP} Traces Refinement Checking. Electr. Notes Theor. Comput. Sci., (2), 135--151. https://doi.org/10.1016/j.entcs.2009.08.022","chicago":"Wehrheim, Heike, and Daniel Wonisch. “Compositional {CSP} Traces Refinement Checking.” Electr. Notes Theor. Comput. Sci., no. 2 (2009): 135--151. https://doi.org/10.1016/j.entcs.2009.08.022."},"user_id":"29719","department":[{"_id":"77"}],"title":"Compositional {CSP} Traces Refinement Checking","_id":"3199"}