[{"date_updated":"2022-11-18T09:45:40Z","author":[{"id":"50003","full_name":"Richter, Cedric","last_name":"Richter","first_name":"Cedric"},{"full_name":"Wehrheim, Heike","first_name":"Heike","last_name":"Wehrheim","id":"573"}],"title":"Learning Realistic Mutations: Bug Creation for Neural Bug Detectors","status":"public","year":"2022","doi":"10.1109/ICST53961.2022.00027","user_id":"477","language":[{"iso":"eng"}],"_id":"32590","page":"162-173","project":[{"_id":"12","name":"SFB 901 - B4: SFB 901 - Subproject B4"},{"name":"SFB 901: SFB 901","_id":"1"},{"name":"SFB 901 - B: SFB 901 - Project Area B","_id":"3"}],"citation":{"ama":"Richter C, Wehrheim H. Learning Realistic Mutations: Bug Creation for Neural Bug Detectors. In: <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>. ; 2022:162-173. doi:<a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>","short":"C. Richter, H. Wehrheim, in: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022, pp. 162–173.","chicago":"Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors.” In <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 162–73, 2022. <a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">https://doi.org/10.1109/ICST53961.2022.00027</a>.","bibtex":"@inproceedings{Richter_Wehrheim_2022, title={Learning Realistic Mutations: Bug Creation for Neural Bug Detectors}, DOI={<a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>}, booktitle={2022 IEEE Conference on Software Testing, Verification and Validation (ICST)}, author={Richter, Cedric and Wehrheim, Heike}, year={2022}, pages={162–173} }","apa":"Richter, C., &#38; Wehrheim, H. (2022). Learning Realistic Mutations: Bug Creation for Neural Bug Detectors. <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 162–173. <a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">https://doi.org/10.1109/ICST53961.2022.00027</a>","mla":"Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors.” <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 2022, pp. 162–73, doi:<a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>.","ieee":"C. Richter and H. Wehrheim, “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors,” in <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 2022, pp. 162–173, doi: <a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>."},"publication":"2022 IEEE Conference on Software Testing, Verification and Validation (ICST)","department":[{"_id":"77"}],"type":"conference","date_created":"2022-08-08T07:40:04Z"}]