{"author":[{"first_name":"Cedric","id":"50003","last_name":"Richter","full_name":"Richter, Cedric"},{"id":"573","last_name":"Wehrheim","full_name":"Wehrheim, Heike","first_name":"Heike"}],"year":"2022","status":"public","project":[{"name":"SFB 901 - B4: SFB 901 - Subproject B4","_id":"12"},{"_id":"1","name":"SFB 901: SFB 901"},{"_id":"3","name":"SFB 901 - B: SFB 901 - Project Area B"}],"date_created":"2022-08-08T07:40:04Z","user_id":"477","citation":{"chicago":"Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors.” In <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 162–73, 2022. <a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">https://doi.org/10.1109/ICST53961.2022.00027</a>.","short":"C. Richter, H. Wehrheim, in: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022, pp. 162–173.","apa":"Richter, C., &#38; Wehrheim, H. (2022). Learning Realistic Mutations: Bug Creation for Neural Bug Detectors. <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 162–173. <a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">https://doi.org/10.1109/ICST53961.2022.00027</a>","ama":"Richter C, Wehrheim H. Learning Realistic Mutations: Bug Creation for Neural Bug Detectors. In: <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>. ; 2022:162-173. doi:<a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>","mla":"Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors.” <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 2022, pp. 162–73, doi:<a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>.","bibtex":"@inproceedings{Richter_Wehrheim_2022, title={Learning Realistic Mutations: Bug Creation for Neural Bug Detectors}, DOI={<a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>}, booktitle={2022 IEEE Conference on Software Testing, Verification and Validation (ICST)}, author={Richter, Cedric and Wehrheim, Heike}, year={2022}, pages={162–173} }","ieee":"C. Richter and H. Wehrheim, “Learning Realistic Mutations: Bug Creation for Neural Bug Detectors,” in <i>2022 IEEE Conference on Software Testing, Verification and Validation (ICST)</i>, 2022, pp. 162–173, doi: <a href=\"https://doi.org/10.1109/ICST53961.2022.00027\">10.1109/ICST53961.2022.00027</a>."},"title":"Learning Realistic Mutations: Bug Creation for Neural Bug Detectors","_id":"32590","department":[{"_id":"77"}],"language":[{"iso":"eng"}],"date_updated":"2022-11-18T09:45:40Z","type":"conference","publication":"2022 IEEE Conference on Software Testing, Verification and Validation (ICST)","page":"162-173","doi":"10.1109/ICST53961.2022.00027"}