---
_id: '32590'
author:
- first_name: Cedric
  full_name: Richter, Cedric
  id: '50003'
  last_name: Richter
- first_name: Heike
  full_name: Wehrheim, Heike
  id: '573'
  last_name: Wehrheim
citation:
  ama: 'Richter C, Wehrheim H. Learning Realistic Mutations: Bug Creation for Neural
    Bug Detectors. In: <i>2022 IEEE Conference on Software Testing, Verification and
    Validation (ICST)</i>. ; 2022:162-173. doi:<a href="https://doi.org/10.1109/ICST53961.2022.00027">10.1109/ICST53961.2022.00027</a>'
  apa: 'Richter, C., &#38; Wehrheim, H. (2022). Learning Realistic Mutations: Bug
    Creation for Neural Bug Detectors. <i>2022 IEEE Conference on Software Testing,
    Verification and Validation (ICST)</i>, 162–173. <a href="https://doi.org/10.1109/ICST53961.2022.00027">https://doi.org/10.1109/ICST53961.2022.00027</a>'
  bibtex: '@inproceedings{Richter_Wehrheim_2022, title={Learning Realistic Mutations:
    Bug Creation for Neural Bug Detectors}, DOI={<a href="https://doi.org/10.1109/ICST53961.2022.00027">10.1109/ICST53961.2022.00027</a>},
    booktitle={2022 IEEE Conference on Software Testing, Verification and Validation
    (ICST)}, author={Richter, Cedric and Wehrheim, Heike}, year={2022}, pages={162–173}
    }'
  chicago: 'Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug
    Creation for Neural Bug Detectors.” In <i>2022 IEEE Conference on Software Testing,
    Verification and Validation (ICST)</i>, 162–73, 2022. <a href="https://doi.org/10.1109/ICST53961.2022.00027">https://doi.org/10.1109/ICST53961.2022.00027</a>.'
  ieee: 'C. Richter and H. Wehrheim, “Learning Realistic Mutations: Bug Creation for
    Neural Bug Detectors,” in <i>2022 IEEE Conference on Software Testing, Verification
    and Validation (ICST)</i>, 2022, pp. 162–173, doi: <a href="https://doi.org/10.1109/ICST53961.2022.00027">10.1109/ICST53961.2022.00027</a>.'
  mla: 'Richter, Cedric, and Heike Wehrheim. “Learning Realistic Mutations: Bug Creation
    for Neural Bug Detectors.” <i>2022 IEEE Conference on Software Testing, Verification
    and Validation (ICST)</i>, 2022, pp. 162–73, doi:<a href="https://doi.org/10.1109/ICST53961.2022.00027">10.1109/ICST53961.2022.00027</a>.'
  short: 'C. Richter, H. Wehrheim, in: 2022 IEEE Conference on Software Testing, Verification
    and Validation (ICST), 2022, pp. 162–173.'
date_created: 2022-08-08T07:40:04Z
date_updated: 2022-11-18T09:45:40Z
department:
- _id: '77'
doi: 10.1109/ICST53961.2022.00027
language:
- iso: eng
page: 162-173
project:
- _id: '12'
  name: 'SFB 901 - B4: SFB 901 - Subproject B4'
- _id: '1'
  name: 'SFB 901: SFB 901'
- _id: '3'
  name: 'SFB 901 - B: SFB 901 - Project Area B'
publication: 2022 IEEE Conference on Software Testing, Verification and Validation
  (ICST)
status: public
title: 'Learning Realistic Mutations: Bug Creation for Neural Bug Detectors'
type: conference
user_id: '477'
year: '2022'
...