{"user_id":"83964","page":" 247-248 ","status":"public","date_created":"2022-10-17T11:59:15Z","editor":[{"full_name":"Henning, Peter A.","last_name":"Henning","first_name":"Peter A."},{"full_name":"Striewe, Michael","last_name":"Striewe","first_name":"Michael"},{"last_name":"Wölfel","full_name":"Wölfel, Matthias","first_name":"Matthias"}],"publication":"20. Fachtagung Bildungstechnologien (DELFI)","date_updated":"2023-01-18T10:11:09Z","title":"E-Assessment-Plattform für die grafische Modellierung","department":[{"_id":"423"}],"publisher":"Gesellschaft für Informatik e.V.","type":"conference","publication_status":"published","_id":"33764","language":[{"iso":"ger"}],"doi":" 10.18420/delfi2022-053 ","place":"Bonn","year":"2022","author":[{"full_name":"Ullrich, Meike","last_name":"Ullrich","first_name":"Meike"},{"full_name":"Pfeiffer, Peter","last_name":"Pfeiffer","first_name":"Peter"},{"first_name":"Gunther","full_name":"Schiefer, Gunther","last_name":"Schiefer"},{"first_name":"Chantal","full_name":"Soyka, Chantal","last_name":"Soyka","id":"83964","orcid":"https://orcid.org/0000-0002-4881-5378"},{"first_name":"Tobias","full_name":"Stottrop, Tobias","last_name":"Stottrop"},{"first_name":"Michael","last_name":"Striewe","full_name":"Striewe, Michael"},{"first_name":"Peter","last_name":"Fettke","full_name":"Fettke, Peter"},{"first_name":"Peter","full_name":"Loos, Peter","last_name":"Loos"},{"first_name":"Andreas","full_name":"Oberweis, Andreas","last_name":"Oberweis"},{"full_name":"Schaper, Niclas","last_name":"Schaper","first_name":"Niclas"}],"citation":{"ieee":"M. Ullrich <i>et al.</i>, “E-Assessment-Plattform für die grafische Modellierung,” in <i>20. Fachtagung Bildungstechnologien (DELFI)</i>, 2022, pp. 247–248, doi: <a href=\"https://doi.org/ 10.18420/delfi2022-053 \"> 10.18420/delfi2022-053 </a>.","apa":"Ullrich, M., Pfeiffer, P., Schiefer, G., Soyka, C., Stottrop, T., Striewe, M., Fettke, P., Loos, P., Oberweis, A., &#38; Schaper, N. (2022). E-Assessment-Plattform für die grafische Modellierung. In P. A. Henning, M. Striewe, &#38; M. Wölfel (Eds.), <i>20. Fachtagung Bildungstechnologien (DELFI)</i> (pp. 247–248). Gesellschaft für Informatik e.V. <a href=\"https://doi.org/ 10.18420/delfi2022-053 \">https://doi.org/ 10.18420/delfi2022-053 </a>","bibtex":"@inproceedings{Ullrich_Pfeiffer_Schiefer_Soyka_Stottrop_Striewe_Fettke_Loos_Oberweis_Schaper_2022, place={Bonn}, title={E-Assessment-Plattform für die grafische Modellierung}, DOI={<a href=\"https://doi.org/ 10.18420/delfi2022-053 \"> 10.18420/delfi2022-053 </a>}, booktitle={20. Fachtagung Bildungstechnologien (DELFI)}, publisher={Gesellschaft für Informatik e.V.}, author={Ullrich, Meike and Pfeiffer, Peter and Schiefer, Gunther and Soyka, Chantal and Stottrop, Tobias and Striewe, Michael and Fettke, Peter and Loos, Peter and Oberweis, Andreas and Schaper, Niclas}, editor={Henning, Peter A. and Striewe, Michael and Wölfel, Matthias}, year={2022}, pages={247–248} }","mla":"Ullrich, Meike, et al. “E-Assessment-Plattform für die grafische Modellierung.” <i>20. Fachtagung Bildungstechnologien (DELFI)</i>, edited by Peter A. Henning et al., Gesellschaft für Informatik e.V., 2022, pp. 247–48, doi:<a href=\"https://doi.org/ 10.18420/delfi2022-053 \"> 10.18420/delfi2022-053 </a>.","chicago":"Ullrich, Meike, Peter Pfeiffer, Gunther Schiefer, Chantal Soyka, Tobias Stottrop, Michael Striewe, Peter Fettke, Peter Loos, Andreas Oberweis, and Niclas Schaper. “E-Assessment-Plattform für die grafische Modellierung.” In <i>20. Fachtagung Bildungstechnologien (DELFI)</i>, edited by Peter A. Henning, Michael Striewe, and Matthias Wölfel, 247–48. Bonn: Gesellschaft für Informatik e.V., 2022. <a href=\"https://doi.org/ 10.18420/delfi2022-053 \">https://doi.org/ 10.18420/delfi2022-053 </a>.","ama":"Ullrich M, Pfeiffer P, Schiefer G, et al. E-Assessment-Plattform für die grafische Modellierung. In: Henning PA, Striewe M, Wölfel M, eds. <i>20. Fachtagung Bildungstechnologien (DELFI)</i>. Gesellschaft für Informatik e.V.; 2022:247-248. doi:<a href=\"https://doi.org/ 10.18420/delfi2022-053 \"> 10.18420/delfi2022-053 </a>","short":"M. Ullrich, P. Pfeiffer, G. Schiefer, C. Soyka, T. Stottrop, M. Striewe, P. Fettke, P. Loos, A. Oberweis, N. Schaper, in: P.A. Henning, M. Striewe, M. Wölfel (Eds.), 20. Fachtagung Bildungstechnologien (DELFI), Gesellschaft für Informatik e.V., Bonn, 2022, pp. 247–248."}}