{"citation":{"ama":"Bürger J, Riedl T, Lindner J. Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images. <i>Ultramicroscopy</i>. 2020;219. doi:<a href=\"https://doi.org/10.1016/j.ultramic.2020.113118\">10.1016/j.ultramic.2020.113118</a>","bibtex":"@article{Bürger_Riedl_Lindner_2020, title={Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images}, volume={219}, DOI={<a href=\"https://doi.org/10.1016/j.ultramic.2020.113118\">10.1016/j.ultramic.2020.113118</a>}, number={113118}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Bürger, Julius and Riedl, Thomas and Lindner, Jörg}, year={2020} }","mla":"Bürger, Julius, et al. “Influence of Lens Aberrations, Specimen Thickness and Tilt on Differential Phase Contrast STEM Images.” <i>Ultramicroscopy</i>, vol. 219, 113118, Elsevier BV, 2020, doi:<a href=\"https://doi.org/10.1016/j.ultramic.2020.113118\">10.1016/j.ultramic.2020.113118</a>.","short":"J. Bürger, T. Riedl, J. Lindner, Ultramicroscopy 219 (2020).","chicago":"Bürger, Julius, Thomas Riedl, and Jörg Lindner. “Influence of Lens Aberrations, Specimen Thickness and Tilt on Differential Phase Contrast STEM Images.” <i>Ultramicroscopy</i> 219 (2020). <a href=\"https://doi.org/10.1016/j.ultramic.2020.113118\">https://doi.org/10.1016/j.ultramic.2020.113118</a>.","apa":"Bürger, J., Riedl, T., &#38; Lindner, J. (2020). Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images. <i>Ultramicroscopy</i>, <i>219</i>, Article 113118. <a href=\"https://doi.org/10.1016/j.ultramic.2020.113118\">https://doi.org/10.1016/j.ultramic.2020.113118</a>","ieee":"J. Bürger, T. Riedl, and J. Lindner, “Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images,” <i>Ultramicroscopy</i>, vol. 219, Art. no. 113118, 2020, doi: <a href=\"https://doi.org/10.1016/j.ultramic.2020.113118\">10.1016/j.ultramic.2020.113118</a>."},"user_id":"77496","volume":219,"_id":"34088","publisher":"Elsevier BV","status":"public","keyword":["Instrumentation","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"type":"journal_article","department":[{"_id":"15"},{"_id":"230"}],"date_created":"2022-11-15T14:15:16Z","publication":"Ultramicroscopy","doi":"10.1016/j.ultramic.2020.113118","article_number":"113118","language":[{"iso":"eng"}],"date_updated":"2023-01-10T12:12:40Z","publication_status":"published","intvolume":"       219","year":"2020","title":"Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images","publication_identifier":{"issn":["0304-3991"]},"author":[{"full_name":"Bürger, Julius","first_name":"Julius","last_name":"Bürger","id":"46952"},{"id":"36950","first_name":"Thomas","last_name":"Riedl","full_name":"Riedl, Thomas"},{"id":"20797","first_name":"Jörg","last_name":"Lindner","full_name":"Lindner, Jörg"}]}