{"publication_status":"published","doi":"10.1016/j.ultramic.2020.113118","language":[{"iso":"eng"}],"status":"public","author":[{"full_name":"Bürger, Julius","last_name":"Bürger","id":"46952","first_name":"Julius"},{"first_name":"Thomas","id":"36950","full_name":"Riedl, Thomas","last_name":"Riedl"},{"id":"20797","first_name":"Jörg","full_name":"Lindner, Jörg","last_name":"Lindner"}],"department":[{"_id":"15"},{"_id":"230"}],"type":"journal_article","publication_identifier":{"issn":["0304-3991"]},"volume":219,"intvolume":" 219","date_created":"2022-11-15T14:15:16Z","date_updated":"2023-01-10T12:12:40Z","year":"2020","_id":"34088","citation":{"apa":"Bürger, J., Riedl, T., & Lindner, J. (2020). Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images. Ultramicroscopy, 219, Article 113118. https://doi.org/10.1016/j.ultramic.2020.113118","chicago":"Bürger, Julius, Thomas Riedl, and Jörg Lindner. “Influence of Lens Aberrations, Specimen Thickness and Tilt on Differential Phase Contrast STEM Images.” Ultramicroscopy 219 (2020). https://doi.org/10.1016/j.ultramic.2020.113118.","short":"J. Bürger, T. Riedl, J. Lindner, Ultramicroscopy 219 (2020).","ama":"Bürger J, Riedl T, Lindner J. Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images. Ultramicroscopy. 2020;219. doi:10.1016/j.ultramic.2020.113118","bibtex":"@article{Bürger_Riedl_Lindner_2020, title={Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images}, volume={219}, DOI={10.1016/j.ultramic.2020.113118}, number={113118}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Bürger, Julius and Riedl, Thomas and Lindner, Jörg}, year={2020} }","ieee":"J. Bürger, T. Riedl, and J. Lindner, “Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images,” Ultramicroscopy, vol. 219, Art. no. 113118, 2020, doi: 10.1016/j.ultramic.2020.113118.","mla":"Bürger, Julius, et al. “Influence of Lens Aberrations, Specimen Thickness and Tilt on Differential Phase Contrast STEM Images.” Ultramicroscopy, vol. 219, 113118, Elsevier BV, 2020, doi:10.1016/j.ultramic.2020.113118."},"title":"Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images","keyword":["Instrumentation","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"publisher":"Elsevier BV","publication":"Ultramicroscopy","user_id":"77496","article_number":"113118"}