--- _id: '34140' abstract: - lang: eng text: In this paper, machine learning techniques will be used to classify different PCB layouts given their electromagnetic frequency spectra. These spectra result from a simulated near-field measurement of electric field strengths at different locations. Measured values consist of real and imaginary parts (amplitude and phase) in X, Y and Z directions. Training data was obtained in the time domain by varying transmission line geometries (size, distance and signaling). It was then transformed into the frequency domain and used as deep neural network input. Principal component analysis was applied to reduce the sample dimension. The results show that classifying different designs is possible with high accuracy based on synthetic data. Future work comprises measurements of real, custom-made PCB with varying parameters to adapt the simulation model and also test the neural network. Finally, the trained model could be used to give hints about the error’s cause when overshooting EMC limits. author: - first_name: Jad full_name: Maalouly, Jad last_name: Maalouly - first_name: Dennis full_name: Hemker, Dennis last_name: Hemker - first_name: Christian full_name: Hedayat, Christian last_name: Hedayat - first_name: Christian full_name: Rückert, Christian last_name: Rückert - first_name: Ivan full_name: Kaufmann, Ivan last_name: Kaufmann - first_name: Marcel full_name: Olbrich, Marcel last_name: Olbrich - first_name: Sven full_name: Lange, Sven id: '38240' last_name: Lange - first_name: Harald full_name: Mathis, Harald last_name: Mathis citation: ama: 'Maalouly J, Hemker D, Hedayat C, et al. AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development. In: 2022 Kleinheubach Conference. IEEE; 2022.' apa: Maalouly, J., Hemker, D., Hedayat, C., Rückert, C., Kaufmann, I., Olbrich, M., Lange, S., & Mathis, H. (2022). AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development. 2022 Kleinheubach Conference. 2022 Kleinheubach Conference, Miltenberg, Germany. bibtex: '@inproceedings{Maalouly_Hemker_Hedayat_Rückert_Kaufmann_Olbrich_Lange_Mathis_2022, place={Miltenberg, Germany}, title={AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development}, booktitle={2022 Kleinheubach Conference}, publisher={IEEE}, author={Maalouly, Jad and Hemker, Dennis and Hedayat, Christian and Rückert, Christian and Kaufmann, Ivan and Olbrich, Marcel and Lange, Sven and Mathis, Harald}, year={2022} }' chicago: 'Maalouly, Jad, Dennis Hemker, Christian Hedayat, Christian Rückert, Ivan Kaufmann, Marcel Olbrich, Sven Lange, and Harald Mathis. “AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development.” In 2022 Kleinheubach Conference. Miltenberg, Germany: IEEE, 2022.' ieee: J. Maalouly et al., “AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development,” presented at the 2022 Kleinheubach Conference, Miltenberg, Germany, 2022. mla: Maalouly, Jad, et al. “AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development.” 2022 Kleinheubach Conference, IEEE, 2022. short: 'J. Maalouly, D. Hemker, C. Hedayat, C. Rückert, I. Kaufmann, M. Olbrich, S. Lange, H. Mathis, in: 2022 Kleinheubach Conference, IEEE, Miltenberg, Germany, 2022.' conference: end_date: 2022-09-29 location: Miltenberg, Germany name: 2022 Kleinheubach Conference start_date: 2022-09-27 date_created: 2022-11-24T14:21:17Z date_updated: 2022-11-24T14:21:34Z department: - _id: '59' - _id: '485' keyword: - emc - pcb - electronic system development - machine learning - neural network language: - iso: eng main_file_link: - url: https://ieeexplore.ieee.org/document/9954484 place: Miltenberg, Germany project: - _id: '52' name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing' publication: 2022 Kleinheubach Conference publication_identifier: eisbn: - 978-3-948571-07-8 publication_status: published publisher: IEEE status: public title: AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development type: conference user_id: '38240' year: '2022' ...