---
_id: '34140'
abstract:
- lang: eng
text: In this paper, machine learning techniques will be used to classify different
PCB layouts given their electromagnetic frequency spectra. These spectra result
from a simulated near-field measurement of electric field strengths at different
locations. Measured values consist of real and imaginary parts (amplitude and
phase) in X, Y and Z directions. Training data was obtained in the time domain
by varying transmission line geometries (size, distance and signaling). It was
then transformed into the frequency domain and used as deep neural network input.
Principal component analysis was applied to reduce the sample dimension. The results
show that classifying different designs is possible with high accuracy based on
synthetic data. Future work comprises measurements of real, custom-made PCB with
varying parameters to adapt the simulation model and also test the neural network.
Finally, the trained model could be used to give hints about the error’s cause
when overshooting EMC limits.
author:
- first_name: Jad
full_name: Maalouly, Jad
last_name: Maalouly
- first_name: Dennis
full_name: Hemker, Dennis
last_name: Hemker
- first_name: Christian
full_name: Hedayat, Christian
last_name: Hedayat
- first_name: Christian
full_name: Rückert, Christian
last_name: Rückert
- first_name: Ivan
full_name: Kaufmann, Ivan
last_name: Kaufmann
- first_name: Marcel
full_name: Olbrich, Marcel
last_name: Olbrich
- first_name: Sven
full_name: Lange, Sven
id: '38240'
last_name: Lange
- first_name: Harald
full_name: Mathis, Harald
last_name: Mathis
citation:
ama: 'Maalouly J, Hemker D, Hedayat C, et al. AI Assisted Interference Classification
to Improve EMC Troubleshooting in Electronic System Development. In: 2022 Kleinheubach
Conference. IEEE; 2022.'
apa: Maalouly, J., Hemker, D., Hedayat, C., Rückert, C., Kaufmann, I., Olbrich,
M., Lange, S., & Mathis, H. (2022). AI Assisted Interference Classification
to Improve EMC Troubleshooting in Electronic System Development. 2022 Kleinheubach
Conference. 2022 Kleinheubach Conference, Miltenberg, Germany.
bibtex: '@inproceedings{Maalouly_Hemker_Hedayat_Rückert_Kaufmann_Olbrich_Lange_Mathis_2022,
place={Miltenberg, Germany}, title={AI Assisted Interference Classification to
Improve EMC Troubleshooting in Electronic System Development}, booktitle={2022
Kleinheubach Conference}, publisher={IEEE}, author={Maalouly, Jad and Hemker,
Dennis and Hedayat, Christian and Rückert, Christian and Kaufmann, Ivan and Olbrich,
Marcel and Lange, Sven and Mathis, Harald}, year={2022} }'
chicago: 'Maalouly, Jad, Dennis Hemker, Christian Hedayat, Christian Rückert, Ivan
Kaufmann, Marcel Olbrich, Sven Lange, and Harald Mathis. “AI Assisted Interference
Classification to Improve EMC Troubleshooting in Electronic System Development.”
In 2022 Kleinheubach Conference. Miltenberg, Germany: IEEE, 2022.'
ieee: J. Maalouly et al., “AI Assisted Interference Classification to Improve
EMC Troubleshooting in Electronic System Development,” presented at the 2022 Kleinheubach
Conference, Miltenberg, Germany, 2022.
mla: Maalouly, Jad, et al. “AI Assisted Interference Classification to Improve EMC
Troubleshooting in Electronic System Development.” 2022 Kleinheubach Conference,
IEEE, 2022.
short: 'J. Maalouly, D. Hemker, C. Hedayat, C. Rückert, I. Kaufmann, M. Olbrich,
S. Lange, H. Mathis, in: 2022 Kleinheubach Conference, IEEE, Miltenberg, Germany,
2022.'
conference:
end_date: 2022-09-29
location: Miltenberg, Germany
name: 2022 Kleinheubach Conference
start_date: 2022-09-27
date_created: 2022-11-24T14:21:17Z
date_updated: 2022-11-24T14:21:34Z
department:
- _id: '59'
- _id: '485'
keyword:
- emc
- pcb
- electronic system development
- machine learning
- neural network
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/9954484
place: Miltenberg, Germany
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: 2022 Kleinheubach Conference
publication_identifier:
eisbn:
- 978-3-948571-07-8
publication_status: published
publisher: IEEE
status: public
title: AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic
System Development
type: conference
user_id: '38240'
year: '2022'
...