{"_id":"35204","status":"public","date_created":"2023-01-04T10:20:41Z","user_id":"36703","department":[{"_id":"48"}],"page":"2","year":"2023","date_updated":"2023-04-06T21:06:37Z","type":"misc","keyword":["WORKSHOP"],"place":"Erfurt, Germany","publisher":"35. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'23), Feb. 2023","language":[{"iso":"eng"}],"citation":{"ama":"Ghazal A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023; 2023.","mla":"Ghazal, Abdulkarim, et al. <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.","ieee":"A. Ghazal, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, <i>On Cryptography Effects on Interconnect Reliability</i>. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.","apa":"Ghazal, A., Sadeghi-Kohan, S., Reimer, J. D., &#38; Hellebrand, S. (2023). <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023.","short":"A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.","bibtex":"@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }","chicago":"Ghazal, Abdulkarim, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. <i>On Cryptography Effects on Interconnect Reliability</i>. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023."},"author":[{"last_name":"Ghazal","first_name":"Abdulkarim","full_name":"Ghazal, Abdulkarim"},{"last_name":"Sadeghi-Kohan","first_name":"Somayeh","full_name":"Sadeghi-Kohan, Somayeh","id":"78614"},{"id":"36703","first_name":"Jan Dennis","last_name":"Reimer","full_name":"Reimer, Jan Dennis"},{"id":"209","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille"}],"title":"On Cryptography Effects on Interconnect Reliability"}