{"status":"public","type":"misc","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"_id":"35204","department":[{"_id":"48"}],"user_id":"36703","place":"Erfurt, Germany","year":"2023","page":"2","citation":{"ieee":"A. Ghazal, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, <i>On Cryptography Effects on Interconnect Reliability</i>. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.","chicago":"Ghazal, Abdulkarim, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. <i>On Cryptography Effects on Interconnect Reliability</i>. Erfurt, Germany: 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.","ama":"Ghazal A, Sadeghi-Kohan S, Reimer JD, Hellebrand S. <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023; 2023.","apa":"Ghazal, A., Sadeghi-Kohan, S., Reimer, J. D., &#38; Hellebrand, S. (2023). <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023.","bibtex":"@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }","short":"A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.","mla":"Ghazal, Abdulkarim, et al. <i>On Cryptography Effects on Interconnect Reliability</i>. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023."},"title":"On Cryptography Effects on Interconnect Reliability","publisher":"35. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'23), Feb. 2023","date_updated":"2023-04-06T21:06:37Z","author":[{"first_name":"Abdulkarim","full_name":"Ghazal, Abdulkarim","last_name":"Ghazal"},{"first_name":"Somayeh","id":"78614","full_name":"Sadeghi-Kohan, Somayeh","last_name":"Sadeghi-Kohan"},{"first_name":"Jan Dennis","id":"36703","full_name":"Reimer, Jan Dennis","last_name":"Reimer"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","full_name":"Hellebrand, Sybille","first_name":"Sybille"}],"date_created":"2023-01-04T10:20:41Z"}