{"date_updated":"2023-01-13T14:40:12Z","issue":"1","intvolume":"        12","abstract":[{"lang":"eng","text":"Abstract. The miniaturisation of components leads to new demands on measurement systems. One of these is the resolution. As a volumetric analysis method and method of non-destructive testing, industrial X-ray computed\r\ntomography (XCT) has the ability to measure geometrical features and their corresponding dimensions without destroying them and can therefore be used for quality assurance. However, the concept of resolution is not trivial for XCT and has not yet been finally clarified. In particular, the interface structural resolution, the detectability of two surfaces facing each other after surface segmentation, faces a lack of a test specimen, a corresponding\r\nmeasurand and a reliable method. Simulation-based XCT investigations of a method to determine this type of resolution are presented in this article using the geometry of a test specimen that contains several radially\r\narranged holes of the same size. The borehole diameters correspond to the distance between the holes to investigate the resolvability of surfaces and interfaces. The evaluation is based on mean and extreme values of grey value\r\nprofiles between the individual boreholes of the reconstructed volume. It is shown that the geometrical detectability of the test specimen surface and interface can be extended by a reasonable choice of the threshold value for\r\nsurface segmentation within a defined interval. With regard to the resolving capability, a distinction is made between assured detectability and possible detectability, as well as the threshold value used when using the ISO50\r\nthreshold for surface segmentation and measurement chain completion. "}],"title":"Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners","publication_identifier":{"issn":["2194-878X"]},"main_file_link":[{"url":"https://jsss.copernicus.org/articles/12/1/2023/","open_access":"1"}],"author":[{"full_name":"Busch, Matthias","last_name":"Busch","first_name":"Matthias"},{"first_name":"Tino","last_name":"Hausotte","full_name":"Hausotte, Tino"}],"publication_status":"published","doi":"10.5194/jsss-12-1-2023","date_created":"2023-01-13T14:37:34Z","department":[{"_id":"630"}],"volume":12,"project":[{"_id":"130","name":"TRR 285: TRR 285","grant_number":"418701707"},{"name":"TRR 285 - C: TRR 285 - Project Area C","_id":"133"},{"_id":"149","name":"TRR 285 – C05: TRR 285 - Subproject C05"}],"language":[{"iso":"eng"}],"page":"1-8","publication":"Journal of Sensors and Sensor Systems","user_id":"7850","year":"2023","status":"public","_id":"36800","oa":"1","keyword":["Electrical and Electronic Engineering","Instrumentation"],"type":"journal_article","publisher":"Copernicus GmbH","citation":{"bibtex":"@article{Busch_Hausotte_2023, title={Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners}, volume={12}, DOI={<a href=\"https://doi.org/10.5194/jsss-12-1-2023\">10.5194/jsss-12-1-2023</a>}, number={1}, journal={Journal of Sensors and Sensor Systems}, publisher={Copernicus GmbH}, author={Busch, Matthias and Hausotte, Tino}, year={2023}, pages={1–8} }","apa":"Busch, M., &#38; Hausotte, T. (2023). Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners. <i>Journal of Sensors and Sensor Systems</i>, <i>12</i>(1), 1–8. <a href=\"https://doi.org/10.5194/jsss-12-1-2023\">https://doi.org/10.5194/jsss-12-1-2023</a>","ieee":"M. Busch and T. Hausotte, “Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners,” <i>Journal of Sensors and Sensor Systems</i>, vol. 12, no. 1, pp. 1–8, 2023, doi: <a href=\"https://doi.org/10.5194/jsss-12-1-2023\">10.5194/jsss-12-1-2023</a>.","ama":"Busch M, Hausotte T. Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners. <i>Journal of Sensors and Sensor Systems</i>. 2023;12(1):1-8. doi:<a href=\"https://doi.org/10.5194/jsss-12-1-2023\">10.5194/jsss-12-1-2023</a>","mla":"Busch, Matthias, and Tino Hausotte. “Simulation-Based Investigation of the Metrological Interface Structural Resolution Capability of X-Ray Computed Tomography Scanners.” <i>Journal of Sensors and Sensor Systems</i>, vol. 12, no. 1, Copernicus GmbH, 2023, pp. 1–8, doi:<a href=\"https://doi.org/10.5194/jsss-12-1-2023\">10.5194/jsss-12-1-2023</a>.","short":"M. Busch, T. Hausotte, Journal of Sensors and Sensor Systems 12 (2023) 1–8.","chicago":"Busch, Matthias, and Tino Hausotte. “Simulation-Based Investigation of the Metrological Interface Structural Resolution Capability of X-Ray Computed Tomography Scanners.” <i>Journal of Sensors and Sensor Systems</i> 12, no. 1 (2023): 1–8. <a href=\"https://doi.org/10.5194/jsss-12-1-2023\">https://doi.org/10.5194/jsss-12-1-2023</a>."}}