---
_id: '36800'
abstract:
- lang: eng
  text: "Abstract. The miniaturisation of components leads to new demands on measurement
    systems. One of these is the resolution. As a volumetric analysis method and method
    of non-destructive testing, industrial X-ray computed\r\ntomography (XCT) has
    the ability to measure geometrical features and their corresponding dimensions
    without destroying them and can therefore be used for quality assurance. However,
    the concept of resolution is not trivial for XCT and has not yet been finally
    clarified. In particular, the interface structural resolution, the detectability
    of two surfaces facing each other after surface segmentation, faces a lack of
    a test specimen, a corresponding\r\nmeasurand and a reliable method. Simulation-based
    XCT investigations of a method to determine this type of resolution are presented
    in this article using the geometry of a test specimen that contains several radially\r\narranged
    holes of the same size. The borehole diameters correspond to the distance between
    the holes to investigate the resolvability of surfaces and interfaces. The evaluation
    is based on mean and extreme values of grey value\r\nprofiles between the individual
    boreholes of the reconstructed volume. It is shown that the geometrical detectability
    of the test specimen surface and interface can be extended by a reasonable choice
    of the threshold value for\r\nsurface segmentation within a defined interval.
    With regard to the resolving capability, a distinction is made between assured
    detectability and possible detectability, as well as the threshold value used
    when using the ISO50\r\nthreshold for surface segmentation and measurement chain
    completion. "
author:
- first_name: Matthias
  full_name: Busch, Matthias
  last_name: Busch
- first_name: Tino
  full_name: Hausotte, Tino
  last_name: Hausotte
citation:
  ama: Busch M, Hausotte T. Simulation-based investigation of the metrological interface
    structural resolution capability of X-ray computed tomography scanners. <i>Journal
    of Sensors and Sensor Systems</i>. 2023;12(1):1-8. doi:<a href="https://doi.org/10.5194/jsss-12-1-2023">10.5194/jsss-12-1-2023</a>
  apa: Busch, M., &#38; Hausotte, T. (2023). Simulation-based investigation of the
    metrological interface structural resolution capability of X-ray computed tomography
    scanners. <i>Journal of Sensors and Sensor Systems</i>, <i>12</i>(1), 1–8. <a
    href="https://doi.org/10.5194/jsss-12-1-2023">https://doi.org/10.5194/jsss-12-1-2023</a>
  bibtex: '@article{Busch_Hausotte_2023, title={Simulation-based investigation of
    the metrological interface structural resolution capability of X-ray computed
    tomography scanners}, volume={12}, DOI={<a href="https://doi.org/10.5194/jsss-12-1-2023">10.5194/jsss-12-1-2023</a>},
    number={1}, journal={Journal of Sensors and Sensor Systems}, publisher={Copernicus
    GmbH}, author={Busch, Matthias and Hausotte, Tino}, year={2023}, pages={1–8} }'
  chicago: 'Busch, Matthias, and Tino Hausotte. “Simulation-Based Investigation of
    the Metrological Interface Structural Resolution Capability of X-Ray Computed
    Tomography Scanners.” <i>Journal of Sensors and Sensor Systems</i> 12, no. 1 (2023):
    1–8. <a href="https://doi.org/10.5194/jsss-12-1-2023">https://doi.org/10.5194/jsss-12-1-2023</a>.'
  ieee: 'M. Busch and T. Hausotte, “Simulation-based investigation of the metrological
    interface structural resolution capability of X-ray computed tomography scanners,”
    <i>Journal of Sensors and Sensor Systems</i>, vol. 12, no. 1, pp. 1–8, 2023, doi:
    <a href="https://doi.org/10.5194/jsss-12-1-2023">10.5194/jsss-12-1-2023</a>.'
  mla: Busch, Matthias, and Tino Hausotte. “Simulation-Based Investigation of the
    Metrological Interface Structural Resolution Capability of X-Ray Computed Tomography
    Scanners.” <i>Journal of Sensors and Sensor Systems</i>, vol. 12, no. 1, Copernicus
    GmbH, 2023, pp. 1–8, doi:<a href="https://doi.org/10.5194/jsss-12-1-2023">10.5194/jsss-12-1-2023</a>.
  short: M. Busch, T. Hausotte, Journal of Sensors and Sensor Systems 12 (2023) 1–8.
date_created: 2023-01-13T14:37:34Z
date_updated: 2023-01-13T14:40:12Z
department:
- _id: '630'
doi: 10.5194/jsss-12-1-2023
intvolume: '        12'
issue: '1'
keyword:
- Electrical and Electronic Engineering
- Instrumentation
language:
- iso: eng
main_file_link:
- open_access: '1'
  url: https://jsss.copernicus.org/articles/12/1/2023/
oa: '1'
page: 1-8
project:
- _id: '130'
  grant_number: '418701707'
  name: 'TRR 285: TRR 285'
- _id: '133'
  name: 'TRR 285 - C: TRR 285 - Project Area C'
- _id: '149'
  name: 'TRR 285 – C05: TRR 285 - Subproject C05'
publication: Journal of Sensors and Sensor Systems
publication_identifier:
  issn:
  - 2194-878X
publication_status: published
publisher: Copernicus GmbH
status: public
title: Simulation-based investigation of the metrological interface structural resolution
  capability of X-ray computed tomography scanners
type: journal_article
user_id: '7850'
volume: 12
year: '2023'
...