{"date_updated":"2023-01-19T13:49:06Z","project":[{"_id":"107","name":"SFB 901 - T3: SFB 901 -Subproject T3"},{"_id":"82","name":"SFB 901 - T: SFB 901 - Project Area T"},{"name":"SFB 901: SFB 901","_id":"1"}],"year":"2023","type":"conference","user_id":"477","_id":"36848","language":[{"iso":"eng"}],"date_created":"2023-01-16T07:17:12Z","main_file_link":[{"url":"https://ieeexplore.ieee.org/document/10006876"}],"doi":"10.1109/scam55253.2022.00007","citation":{"mla":"Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>.","short":"S. Schott, F. Pauck, in: 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM), IEEE, 2023.","apa":"Schott, S., &#38; Pauck, F. (2023). Benchmark Fuzzing for Android Taint Analyses. <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>. <a href=\"https://doi.org/10.1109/scam55253.2022.00007\">https://doi.org/10.1109/scam55253.2022.00007</a>","bibtex":"@inproceedings{Schott_Pauck_2023, title={Benchmark Fuzzing for Android Taint Analyses}, DOI={<a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>}, booktitle={2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)}, publisher={IEEE}, author={Schott, Stefan and Pauck, Felix}, year={2023} }","ama":"Schott S, Pauck F. Benchmark Fuzzing for Android Taint Analyses. In: <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>","ieee":"S. Schott and F. Pauck, “Benchmark Fuzzing for Android Taint Analyses,” 2023, doi: <a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>.","chicago":"Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” In <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/scam55253.2022.00007\">https://doi.org/10.1109/scam55253.2022.00007</a>."},"status":"public","author":[{"full_name":"Schott, Stefan","id":"54847","last_name":"Schott","first_name":"Stefan"},{"first_name":"Felix","id":"22398","full_name":"Pauck, Felix","last_name":"Pauck"}],"title":"Benchmark Fuzzing for Android Taint Analyses","publication":"2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)","department":[{"_id":"77"}],"publisher":"IEEE","publication_status":"published"}