{"date_updated":"2023-01-19T13:49:06Z","project":[{"_id":"107","name":"SFB 901 - T3: SFB 901 -Subproject T3"},{"_id":"82","name":"SFB 901 - T: SFB 901 - Project Area T"},{"name":"SFB 901: SFB 901","_id":"1"}],"year":"2023","type":"conference","user_id":"477","_id":"36848","language":[{"iso":"eng"}],"date_created":"2023-01-16T07:17:12Z","main_file_link":[{"url":"https://ieeexplore.ieee.org/document/10006876"}],"doi":"10.1109/scam55253.2022.00007","citation":{"mla":"Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM), IEEE, 2023, doi:10.1109/scam55253.2022.00007.","short":"S. Schott, F. Pauck, in: 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM), IEEE, 2023.","apa":"Schott, S., & Pauck, F. (2023). Benchmark Fuzzing for Android Taint Analyses. 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM). https://doi.org/10.1109/scam55253.2022.00007","bibtex":"@inproceedings{Schott_Pauck_2023, title={Benchmark Fuzzing for Android Taint Analyses}, DOI={10.1109/scam55253.2022.00007}, booktitle={2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)}, publisher={IEEE}, author={Schott, Stefan and Pauck, Felix}, year={2023} }","ama":"Schott S, Pauck F. Benchmark Fuzzing for Android Taint Analyses. In: 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM). IEEE; 2023. doi:10.1109/scam55253.2022.00007","ieee":"S. Schott and F. Pauck, “Benchmark Fuzzing for Android Taint Analyses,” 2023, doi: 10.1109/scam55253.2022.00007.","chicago":"Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” In 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM). IEEE, 2023. https://doi.org/10.1109/scam55253.2022.00007."},"status":"public","author":[{"full_name":"Schott, Stefan","id":"54847","last_name":"Schott","first_name":"Stefan"},{"first_name":"Felix","id":"22398","full_name":"Pauck, Felix","last_name":"Pauck"}],"title":"Benchmark Fuzzing for Android Taint Analyses","publication":"2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)","department":[{"_id":"77"}],"publisher":"IEEE","publication_status":"published"}