{"doi":"10.1109/scam55253.2022.00007","date_created":"2023-01-16T07:17:12Z","status":"public","publication_status":"published","main_file_link":[{"url":"https://ieeexplore.ieee.org/document/10006876"}],"user_id":"477","year":"2023","department":[{"_id":"77"}],"author":[{"full_name":"Schott, Stefan","last_name":"Schott","id":"54847","first_name":"Stefan"},{"id":"22398","first_name":"Felix","full_name":"Pauck, Felix","last_name":"Pauck"}],"publication":"2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)","date_updated":"2023-01-19T13:49:06Z","citation":{"ieee":"S. Schott and F. Pauck, “Benchmark Fuzzing for Android Taint Analyses,” 2023, doi: <a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>.","short":"S. Schott, F. Pauck, in: 2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM), IEEE, 2023.","chicago":"Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” In <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>. IEEE, 2023. <a href=\"https://doi.org/10.1109/scam55253.2022.00007\">https://doi.org/10.1109/scam55253.2022.00007</a>.","apa":"Schott, S., &#38; Pauck, F. (2023). Benchmark Fuzzing for Android Taint Analyses. <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>. <a href=\"https://doi.org/10.1109/scam55253.2022.00007\">https://doi.org/10.1109/scam55253.2022.00007</a>","bibtex":"@inproceedings{Schott_Pauck_2023, title={Benchmark Fuzzing for Android Taint Analyses}, DOI={<a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>}, booktitle={2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)}, publisher={IEEE}, author={Schott, Stefan and Pauck, Felix}, year={2023} }","mla":"Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.” <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>, IEEE, 2023, doi:<a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>.","ama":"Schott S, Pauck F. Benchmark Fuzzing for Android Taint Analyses. In: <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)</i>. IEEE; 2023. doi:<a href=\"https://doi.org/10.1109/scam55253.2022.00007\">10.1109/scam55253.2022.00007</a>"},"type":"conference","project":[{"name":"SFB 901 - T3: SFB 901 -Subproject T3","_id":"107"},{"_id":"82","name":"SFB 901 - T: SFB 901 - Project Area T"},{"_id":"1","name":"SFB 901: SFB 901"}],"language":[{"iso":"eng"}],"_id":"36848","title":"Benchmark Fuzzing for Android Taint Analyses","publisher":"IEEE"}