---
_id: '36848'
author:
- first_name: Stefan
  full_name: Schott, Stefan
  id: '54847'
  last_name: Schott
- first_name: Felix
  full_name: Pauck, Felix
  id: '22398'
  last_name: Pauck
citation:
  ama: 'Schott S, Pauck F. Benchmark Fuzzing for Android Taint Analyses. In: <i>2022
    IEEE 22nd International Working Conference on Source Code Analysis and Manipulation
    (SCAM)</i>. IEEE; 2023. doi:<a href="https://doi.org/10.1109/scam55253.2022.00007">10.1109/scam55253.2022.00007</a>'
  apa: Schott, S., &#38; Pauck, F. (2023). Benchmark Fuzzing for Android Taint Analyses.
    <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and
    Manipulation (SCAM)</i>. <a href="https://doi.org/10.1109/scam55253.2022.00007">https://doi.org/10.1109/scam55253.2022.00007</a>
  bibtex: '@inproceedings{Schott_Pauck_2023, title={Benchmark Fuzzing for Android
    Taint Analyses}, DOI={<a href="https://doi.org/10.1109/scam55253.2022.00007">10.1109/scam55253.2022.00007</a>},
    booktitle={2022 IEEE 22nd International Working Conference on Source Code Analysis
    and Manipulation (SCAM)}, publisher={IEEE}, author={Schott, Stefan and Pauck,
    Felix}, year={2023} }'
  chicago: Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.”
    In <i>2022 IEEE 22nd International Working Conference on Source Code Analysis
    and Manipulation (SCAM)</i>. IEEE, 2023. <a href="https://doi.org/10.1109/scam55253.2022.00007">https://doi.org/10.1109/scam55253.2022.00007</a>.
  ieee: 'S. Schott and F. Pauck, “Benchmark Fuzzing for Android Taint Analyses,” 2023,
    doi: <a href="https://doi.org/10.1109/scam55253.2022.00007">10.1109/scam55253.2022.00007</a>.'
  mla: Schott, Stefan, and Felix Pauck. “Benchmark Fuzzing for Android Taint Analyses.”
    <i>2022 IEEE 22nd International Working Conference on Source Code Analysis and
    Manipulation (SCAM)</i>, IEEE, 2023, doi:<a href="https://doi.org/10.1109/scam55253.2022.00007">10.1109/scam55253.2022.00007</a>.
  short: 'S. Schott, F. Pauck, in: 2022 IEEE 22nd International Working Conference
    on Source Code Analysis and Manipulation (SCAM), IEEE, 2023.'
date_created: 2023-01-16T07:17:12Z
date_updated: 2023-01-19T13:49:06Z
department:
- _id: '77'
doi: 10.1109/scam55253.2022.00007
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/document/10006876
project:
- _id: '107'
  name: 'SFB 901 - T3: SFB 901 -Subproject T3'
- _id: '82'
  name: 'SFB 901 - T: SFB 901 - Project Area T'
- _id: '1'
  name: 'SFB 901: SFB 901'
publication: 2022 IEEE 22nd International Working Conference on Source Code Analysis
  and Manipulation (SCAM)
publication_status: published
publisher: IEEE
status: public
title: Benchmark Fuzzing for Android Taint Analyses
type: conference
user_id: '477'
year: '2023'
...