{"department":[{"_id":"672"}],"doi":"10.1109/DATE.2010.5457186","keyword":["System testing","Automatic testing","Object oriented modeling","Classification tree analysis","Automotive engineering","Mathematical model","Embedded system","Control systems","Electronic equipment testing","Software testing"],"author":[{"first_name":"Alexander","last_name":"Krupp","full_name":"Krupp, Alexander"},{"id":"16243","last_name":"Müller","first_name":"Wolfgang","full_name":"Müller, Wolfgang"}],"status":"public","user_id":"5786","type":"conference","date_updated":"2023-01-17T10:41:25Z","title":"A Systematic Approach to Combined HW/SW System Test","citation":{"bibtex":"@inproceedings{Krupp_Müller_2010, place={Dresden}, title={A Systematic Approach to Combined HW/SW System Test}, DOI={<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>}, booktitle={Proceedings of DATE’10}, publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2010} }","short":"A. Krupp, W. Müller, in: Proceedings of DATE’10, IEEE, Dresden, 2010.","ieee":"A. Krupp and W. Müller, “A Systematic Approach to Combined HW/SW System Test,” presented at the Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden, 2010, doi: <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>.","chicago":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” In <i>Proceedings of DATE’10</i>. Dresden: IEEE, 2010. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>.","mla":"Krupp, Alexander, and Wolfgang Müller. “A Systematic Approach to Combined HW/SW System Test.” <i>Proceedings of DATE’10</i>, IEEE, 2010, doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>.","apa":"Krupp, A., &#38; Müller, W. (2010). A Systematic Approach to Combined HW/SW System Test. <i>Proceedings of DATE’10</i>. Design, Automation &#38; Test in Europe Conference &#38; Exhibition (DATE 2010), Dresden. <a href=\"https://doi.org/10.1109/DATE.2010.5457186\">https://doi.org/10.1109/DATE.2010.5457186</a>","ama":"Krupp A, Müller W. A Systematic Approach to Combined HW/SW System Test. In: <i>Proceedings of DATE’10</i>. IEEE; 2010. doi:<a href=\"https://doi.org/10.1109/DATE.2010.5457186\">10.1109/DATE.2010.5457186</a>"},"abstract":[{"lang":"eng","text":"Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embedded Systems (CTM/ES) to fill this gap by new concepts for the precise specification of stimuli for operational ranges of continuous control systems. It introduces novel means for continuous acceptance criteria definition and for functional coverage definition."}],"language":[{"iso":"eng"}],"_id":"37037","year":"2010","place":"Dresden","publisher":"IEEE","publication":"Proceedings of DATE’10","conference":{"location":"Dresden","name":"Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"},"date_created":"2023-01-17T10:41:15Z"}