{"_id":"38307","title":"Tolerance of bandwidth-efficient optical multilevel modulation schemes against polarization mode dispersion","citation":{"ama":"Hinz S, Noé R, Sandel D, Wust F. Tolerance of bandwidth-efficient optical multilevel modulation schemes against polarization mode dispersion. <i>ELECTRICAL ENGINEERING</i>. 2001;83(3):129-132. doi:<a href=\"https://doi.org/10.1007/s002020100068\">10.1007/s002020100068</a>","chicago":"Hinz, S, Reinhold Noé, D Sandel, and F Wust. “Tolerance of Bandwidth-Efficient Optical Multilevel Modulation Schemes against Polarization Mode Dispersion.” <i>ELECTRICAL ENGINEERING</i> 83, no. 3 (2001): 129–32. <a href=\"https://doi.org/10.1007/s002020100068\">https://doi.org/10.1007/s002020100068</a>.","apa":"Hinz, S., Noé, R., Sandel, D., &#38; Wust, F. (2001). Tolerance of bandwidth-efficient optical multilevel modulation schemes against polarization mode dispersion. <i>ELECTRICAL ENGINEERING</i>, <i>83</i>(3), 129–132. <a href=\"https://doi.org/10.1007/s002020100068\">https://doi.org/10.1007/s002020100068</a>","short":"S. Hinz, R. Noé, D. Sandel, F. Wust, ELECTRICAL ENGINEERING 83 (2001) 129–132.","bibtex":"@article{Hinz_Noé_Sandel_Wust_2001, title={Tolerance of bandwidth-efficient optical multilevel modulation schemes against polarization mode dispersion}, volume={83}, DOI={<a href=\"https://doi.org/10.1007/s002020100068\">10.1007/s002020100068</a>}, number={3}, journal={ELECTRICAL ENGINEERING}, author={Hinz, S and Noé, Reinhold and Sandel, D and Wust, F}, year={2001}, pages={129–132} }","ieee":"S. Hinz, R. Noé, D. Sandel, and F. Wust, “Tolerance of bandwidth-efficient optical multilevel modulation schemes against polarization mode dispersion,” <i>ELECTRICAL ENGINEERING</i>, vol. 83, no. 3, pp. 129–132, 2001, doi: <a href=\"https://doi.org/10.1007/s002020100068\">10.1007/s002020100068</a>.","mla":"Hinz, S., et al. “Tolerance of Bandwidth-Efficient Optical Multilevel Modulation Schemes against Polarization Mode Dispersion.” <i>ELECTRICAL ENGINEERING</i>, vol. 83, no. 3, 2001, pp. 129–32, doi:<a href=\"https://doi.org/10.1007/s002020100068\">10.1007/s002020100068</a>."},"year":"2001","page":"129-132","issue":"3","publication":"ELECTRICAL ENGINEERING","user_id":"14931","department":[{"_id":"56"}],"status":"public","author":[{"first_name":"S","last_name":"Hinz","full_name":"Hinz, S"},{"id":"381","first_name":"Reinhold","full_name":"Noé, Reinhold","orcid":"https://orcid.org/0000-0002-5839-7616","last_name":"Noé"},{"last_name":"Sandel","full_name":"Sandel, D","first_name":"D"},{"full_name":"Wust, F","last_name":"Wust","first_name":"F"}],"language":[{"iso":"eng"}],"doi":"10.1007/s002020100068","date_updated":"2023-01-25T22:47:18Z","date_created":"2023-01-23T18:11:14Z","intvolume":"        83","publication_identifier":{"issn":["0948-7921"]},"volume":83,"type":"journal_article"}