{"page":"2127-2138","status":"public","type":"journal_article","doi":"10.1109/JLT.2014.2386651","date_created":"2023-01-23T18:22:00Z","issue":"10","date_updated":"2023-01-25T15:23:54Z","publication_identifier":{"issn":["0733-8724"]},"citation":{"chicago":"Noé, Reinhold, Benjamin Koch, David Sandel, and Vitali Mirvoda. “Polarization-Dependent Loss: New Definition and Measurement Techniques.” <i>JOURNAL OF LIGHTWAVE TECHNOLOGY</i> 33, no. 10 (2015): 2127–38. <a href=\"https://doi.org/10.1109/JLT.2014.2386651\">https://doi.org/10.1109/JLT.2014.2386651</a>.","short":"R. Noé, B. Koch, D. Sandel, V. Mirvoda, JOURNAL OF LIGHTWAVE TECHNOLOGY 33 (2015) 2127–2138.","ama":"Noé R, Koch B, Sandel D, Mirvoda V. Polarization-Dependent Loss: New Definition and Measurement Techniques. <i>JOURNAL OF LIGHTWAVE TECHNOLOGY</i>. 2015;33(10):2127-2138. doi:<a href=\"https://doi.org/10.1109/JLT.2014.2386651\">10.1109/JLT.2014.2386651</a>","bibtex":"@article{Noé_Koch_Sandel_Mirvoda_2015, title={Polarization-Dependent Loss: New Definition and Measurement Techniques}, volume={33}, DOI={<a href=\"https://doi.org/10.1109/JLT.2014.2386651\">10.1109/JLT.2014.2386651</a>}, number={10}, journal={JOURNAL OF LIGHTWAVE TECHNOLOGY}, author={Noé, Reinhold and Koch, Benjamin and Sandel, David and Mirvoda, Vitali}, year={2015}, pages={2127–2138} }","ieee":"R. Noé, B. Koch, D. Sandel, and V. Mirvoda, “Polarization-Dependent Loss: New Definition and Measurement Techniques,” <i>JOURNAL OF LIGHTWAVE TECHNOLOGY</i>, vol. 33, no. 10, pp. 2127–2138, 2015, doi: <a href=\"https://doi.org/10.1109/JLT.2014.2386651\">10.1109/JLT.2014.2386651</a>.","mla":"Noé, Reinhold, et al. “Polarization-Dependent Loss: New Definition and Measurement Techniques.” <i>JOURNAL OF LIGHTWAVE TECHNOLOGY</i>, vol. 33, no. 10, 2015, pp. 2127–38, doi:<a href=\"https://doi.org/10.1109/JLT.2014.2386651\">10.1109/JLT.2014.2386651</a>.","apa":"Noé, R., Koch, B., Sandel, D., &#38; Mirvoda, V. (2015). Polarization-Dependent Loss: New Definition and Measurement Techniques. <i>JOURNAL OF LIGHTWAVE TECHNOLOGY</i>, <i>33</i>(10), 2127–2138. <a href=\"https://doi.org/10.1109/JLT.2014.2386651\">https://doi.org/10.1109/JLT.2014.2386651</a>"},"language":[{"iso":"eng"}],"publication":"JOURNAL OF LIGHTWAVE TECHNOLOGY","_id":"38437","volume":33,"year":"2015","author":[{"orcid":"https://orcid.org/0000-0002-5839-7616","full_name":"Noé, Reinhold","last_name":"Noé","first_name":"Reinhold","id":"381"},{"last_name":"Koch","full_name":"Koch, Benjamin","first_name":"Benjamin"},{"last_name":"Sandel","full_name":"Sandel, David","first_name":"David"},{"last_name":"Mirvoda","full_name":"Mirvoda, Vitali","first_name":"Vitali"}],"title":"Polarization-Dependent Loss: New Definition and Measurement Techniques","department":[{"_id":"56"}],"intvolume":"        33","user_id":"14931"}