{"intvolume":" 16","page":"1210-1216","status":"public","author":[{"full_name":"Pfau, Timo","first_name":"Timo","last_name":"Pfau"},{"first_name":"Reinhold","last_name":"Noé","id":"381","orcid":"https://orcid.org/0000-0002-5839-7616","full_name":"Noé, Reinhold"}],"date_updated":"2023-01-25T13:39:25Z","title":"Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats","user_id":"14931","type":"journal_article","_id":"38484","year":"2010","citation":{"bibtex":"@article{Pfau_Noé_2010, title={Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats}, volume={16}, DOI={10.1109/JSTQE.2009.2034472}, number={5}, journal={IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS}, author={Pfau, Timo and Noé, Reinhold}, year={2010}, pages={1210–1216} }","apa":"Pfau, T., & Noé, R. (2010). Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 16(5), 1210–1216. https://doi.org/10.1109/JSTQE.2009.2034472","ama":"Pfau T, Noé R. Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats. IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS. 2010;16(5):1210-1216. doi:10.1109/JSTQE.2009.2034472","chicago":"Pfau, Timo, and Reinhold Noé. “Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats.” IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 16, no. 5 (2010): 1210–16. https://doi.org/10.1109/JSTQE.2009.2034472.","mla":"Pfau, Timo, and Reinhold Noé. “Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats.” IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, vol. 16, no. 5, 2010, pp. 1210–16, doi:10.1109/JSTQE.2009.2034472.","short":"T. Pfau, R. Noé, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 16 (2010) 1210–1216.","ieee":"T. Pfau and R. Noé, “Phase-Noise-Tolerant Two-Stage Carrier Recovery Concept for Higher Order QAM Formats,” IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, vol. 16, no. 5, pp. 1210–1216, 2010, doi: 10.1109/JSTQE.2009.2034472."},"language":[{"iso":"eng"}],"publication_identifier":{"issn":["1077-260X"]},"date_created":"2023-01-23T18:22:07Z","publication":"IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS","doi":"10.1109/JSTQE.2009.2034472","department":[{"_id":"56"}],"issue":"5","volume":16}