{"publication":"2022 Smart Systems Integration (SSI)","citation":{"chicago":"Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian Hedayat, and Harald Kuhn. “Detection of Defects on Irregularly Structured Surfaces Using Supervised and Semi-Supervised Learning Methods.” In 2022 Smart Systems Integration (SSI). IEEE, 2022. https://doi.org/10.1109/ssi56489.2022.9901433.","mla":"Sander, Tom, et al. “Detection of Defects on Irregularly Structured Surfaces Using Supervised and Semi-Supervised Learning Methods.” 2022 Smart Systems Integration (SSI), IEEE, 2022, doi:10.1109/ssi56489.2022.9901433.","apa":"Sander, T., Lange, S., Hilleringmann, U., Geneis, V., Hedayat, C., & Kuhn, H. (2022). Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods. 2022 Smart Systems Integration (SSI). https://doi.org/10.1109/ssi56489.2022.9901433","short":"T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, H. Kuhn, in: 2022 Smart Systems Integration (SSI), IEEE, 2022.","ieee":"T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, and H. Kuhn, “Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods,” 2022, doi: 10.1109/ssi56489.2022.9901433.","ama":"Sander T, Lange S, Hilleringmann U, Geneis V, Hedayat C, Kuhn H. Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods. In: 2022 Smart Systems Integration (SSI). IEEE; 2022. doi:10.1109/ssi56489.2022.9901433","bibtex":"@inproceedings{Sander_Lange_Hilleringmann_Geneis_Hedayat_Kuhn_2022, title={Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods}, DOI={10.1109/ssi56489.2022.9901433}, booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Sander, Tom and Lange, Sven and Hilleringmann, Ulrich and Geneis, Volker and Hedayat, Christian and Kuhn, Harald}, year={2022} }"},"title":"Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods","_id":"39376","date_updated":"2023-03-22T10:28:37Z","doi":"10.1109/ssi56489.2022.9901433","user_id":"20179","type":"conference","publisher":"IEEE","language":[{"iso":"eng"}],"publication_status":"published","date_created":"2023-01-24T10:05:48Z","year":"2022","author":[{"first_name":"Tom","last_name":"Sander","full_name":"Sander, Tom"},{"first_name":"Sven","full_name":"Lange, Sven","last_name":"Lange"},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich","id":"20179"},{"last_name":"Geneis","full_name":"Geneis, Volker","first_name":"Volker"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"},{"first_name":"Harald","full_name":"Kuhn, Harald","last_name":"Kuhn"}],"department":[{"_id":"59"}],"status":"public"}