{"date_created":"2023-01-24T10:05:48Z","status":"public","doi":"10.1109/ssi56489.2022.9901433","date_updated":"2023-03-22T10:28:37Z","publication":"2022 Smart Systems Integration (SSI)","citation":{"bibtex":"@inproceedings{Sander_Lange_Hilleringmann_Geneis_Hedayat_Kuhn_2022, title={Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods}, DOI={<a href=\"https://doi.org/10.1109/ssi56489.2022.9901433\">10.1109/ssi56489.2022.9901433</a>}, booktitle={2022 Smart Systems Integration (SSI)}, publisher={IEEE}, author={Sander, Tom and Lange, Sven and Hilleringmann, Ulrich and Geneis, Volker and Hedayat, Christian and Kuhn, Harald}, year={2022} }","ama":"Sander T, Lange S, Hilleringmann U, Geneis V, Hedayat C, Kuhn H. Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods. In: <i>2022 Smart Systems Integration (SSI)</i>. IEEE; 2022. doi:<a href=\"https://doi.org/10.1109/ssi56489.2022.9901433\">10.1109/ssi56489.2022.9901433</a>","short":"T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, H. Kuhn, in: 2022 Smart Systems Integration (SSI), IEEE, 2022.","mla":"Sander, Tom, et al. “Detection of Defects on Irregularly Structured Surfaces Using Supervised and Semi-Supervised Learning Methods.” <i>2022 Smart Systems Integration (SSI)</i>, IEEE, 2022, doi:<a href=\"https://doi.org/10.1109/ssi56489.2022.9901433\">10.1109/ssi56489.2022.9901433</a>.","chicago":"Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian Hedayat, and Harald Kuhn. “Detection of Defects on Irregularly Structured Surfaces Using Supervised and Semi-Supervised Learning Methods.” In <i>2022 Smart Systems Integration (SSI)</i>. IEEE, 2022. <a href=\"https://doi.org/10.1109/ssi56489.2022.9901433\">https://doi.org/10.1109/ssi56489.2022.9901433</a>.","ieee":"T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, and H. Kuhn, “Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods,” 2022, doi: <a href=\"https://doi.org/10.1109/ssi56489.2022.9901433\">10.1109/ssi56489.2022.9901433</a>.","apa":"Sander, T., Lange, S., Hilleringmann, U., Geneis, V., Hedayat, C., &#38; Kuhn, H. (2022). Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods. <i>2022 Smart Systems Integration (SSI)</i>. <a href=\"https://doi.org/10.1109/ssi56489.2022.9901433\">https://doi.org/10.1109/ssi56489.2022.9901433</a>"},"_id":"39376","user_id":"20179","publisher":"IEEE","language":[{"iso":"eng"}],"type":"conference","department":[{"_id":"59"}],"author":[{"last_name":"Sander","full_name":"Sander, Tom","first_name":"Tom"},{"full_name":"Lange, Sven","last_name":"Lange","first_name":"Sven"},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich","id":"20179"},{"full_name":"Geneis, Volker","last_name":"Geneis","first_name":"Volker"},{"first_name":"Christian","full_name":"Hedayat, Christian","last_name":"Hedayat"},{"first_name":"Harald","full_name":"Kuhn, Harald","last_name":"Kuhn"}],"publication_status":"published","year":"2022","title":"Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods"}