{"citation":{"short":"J. Reker, T. Meyers, F.F. Vidor, T.-H. Joubert, U. Hilleringmann, in: 2021 IEEE AFRICON, IEEE, 2021.","apa":"Reker, J., Meyers, T., Vidor, F. F., Joubert, T.-H., &#38; Hilleringmann, U. (2021). Influence of electrode metallization on thin-film transistor performance. <i>2021 IEEE AFRICON</i>. <a href=\"https://doi.org/10.1109/africon51333.2021.9570953\">https://doi.org/10.1109/africon51333.2021.9570953</a>","mla":"Reker, Julia, et al. “Influence of Electrode Metallization on Thin-Film Transistor Performance.” <i>2021 IEEE AFRICON</i>, IEEE, 2021, doi:<a href=\"https://doi.org/10.1109/africon51333.2021.9570953\">10.1109/africon51333.2021.9570953</a>.","ama":"Reker J, Meyers T, Vidor FF, Joubert T-H, Hilleringmann U. Influence of electrode metallization on thin-film transistor performance. In: <i>2021 IEEE AFRICON</i>. IEEE; 2021. doi:<a href=\"https://doi.org/10.1109/africon51333.2021.9570953\">10.1109/africon51333.2021.9570953</a>","bibtex":"@inproceedings{Reker_Meyers_Vidor_Joubert_Hilleringmann_2021, title={Influence of electrode metallization on thin-film transistor performance}, DOI={<a href=\"https://doi.org/10.1109/africon51333.2021.9570953\">10.1109/africon51333.2021.9570953</a>}, booktitle={2021 IEEE AFRICON}, publisher={IEEE}, author={Reker, Julia and Meyers, Thorsten and Vidor, Fabio F. and Joubert, Trudi-Heleen and Hilleringmann, Ulrich}, year={2021} }","ieee":"J. Reker, T. Meyers, F. F. Vidor, T.-H. Joubert, and U. Hilleringmann, “Influence of electrode metallization on thin-film transistor performance,” 2021, doi: <a href=\"https://doi.org/10.1109/africon51333.2021.9570953\">10.1109/africon51333.2021.9570953</a>.","chicago":"Reker, Julia, Thorsten Meyers, Fabio F. Vidor, Trudi-Heleen Joubert, and Ulrich Hilleringmann. “Influence of Electrode Metallization on Thin-Film Transistor Performance.” In <i>2021 IEEE AFRICON</i>. IEEE, 2021. <a href=\"https://doi.org/10.1109/africon51333.2021.9570953\">https://doi.org/10.1109/africon51333.2021.9570953</a>."},"status":"public","author":[{"first_name":"Julia","full_name":"Reker, Julia","last_name":"Reker"},{"full_name":"Meyers, Thorsten","last_name":"Meyers","first_name":"Thorsten"},{"full_name":"Vidor, Fabio F.","last_name":"Vidor","first_name":"Fabio F."},{"first_name":"Trudi-Heleen","full_name":"Joubert, Trudi-Heleen","last_name":"Joubert"},{"first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179","last_name":"Hilleringmann"}],"title":"Influence of electrode metallization on thin-film transistor performance","publication":"2021 IEEE AFRICON","department":[{"_id":"59"}],"publisher":"IEEE","publication_status":"published","date_updated":"2023-03-22T10:23:56Z","year":"2021","type":"conference","user_id":"20179","_id":"39384","date_created":"2023-01-24T10:08:41Z","language":[{"iso":"eng"}],"doi":"10.1109/africon51333.2021.9570953"}