{"title":"Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction","type":"conference","date_updated":"2023-03-22T10:31:28Z","_id":"39392","publication":"2021 22nd IEEE International Conference on Industrial Technology (ICIT)","doi":"10.1109/icit46573.2021.9453646","year":"2021","publisher":"IEEE","user_id":"20179","language":[{"iso":"eng"}],"citation":{"chicago":"Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian Hedayat, Harald Kuhn, and Franz-Barthold Gockel. “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction.” In <i>2021 22nd IEEE International Conference on Industrial Technology (ICIT)</i>. IEEE, 2021. <a href=\"https://doi.org/10.1109/icit46573.2021.9453646\">https://doi.org/10.1109/icit46573.2021.9453646</a>.","apa":"Sander, T., Lange, S., Hilleringmann, U., Geneis, V., Hedayat, C., Kuhn, H., &#38; Gockel, F.-B. (2021). Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction. <i>2021 22nd IEEE International Conference on Industrial Technology (ICIT)</i>. <a href=\"https://doi.org/10.1109/icit46573.2021.9453646\">https://doi.org/10.1109/icit46573.2021.9453646</a>","short":"T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, H. Kuhn, F.-B. Gockel, in: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), IEEE, 2021.","bibtex":"@inproceedings{Sander_Lange_Hilleringmann_Geneis_Hedayat_Kuhn_Gockel_2021, title={Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction}, DOI={<a href=\"https://doi.org/10.1109/icit46573.2021.9453646\">10.1109/icit46573.2021.9453646</a>}, booktitle={2021 22nd IEEE International Conference on Industrial Technology (ICIT)}, publisher={IEEE}, author={Sander, Tom and Lange, Sven and Hilleringmann, Ulrich and Geneis, Volker and Hedayat, Christian and Kuhn, Harald and Gockel, Franz-Barthold}, year={2021} }","ama":"Sander T, Lange S, Hilleringmann U, et al. Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction. In: <i>2021 22nd IEEE International Conference on Industrial Technology (ICIT)</i>. IEEE; 2021. doi:<a href=\"https://doi.org/10.1109/icit46573.2021.9453646\">10.1109/icit46573.2021.9453646</a>","ieee":"T. Sander <i>et al.</i>, “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction,” 2021, doi: <a href=\"https://doi.org/10.1109/icit46573.2021.9453646\">10.1109/icit46573.2021.9453646</a>.","mla":"Sander, Tom, et al. “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction.” <i>2021 22nd IEEE International Conference on Industrial Technology (ICIT)</i>, IEEE, 2021, doi:<a href=\"https://doi.org/10.1109/icit46573.2021.9453646\">10.1109/icit46573.2021.9453646</a>."},"status":"public","publication_status":"published","department":[{"_id":"59"}],"date_created":"2023-01-24T10:12:47Z","author":[{"last_name":"Sander","first_name":"Tom","full_name":"Sander, Tom"},{"last_name":"Lange","first_name":"Sven","full_name":"Lange, Sven"},{"first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179"},{"first_name":"Volker","last_name":"Geneis","full_name":"Geneis, Volker"},{"full_name":"Hedayat, Christian","last_name":"Hedayat","first_name":"Christian"},{"full_name":"Kuhn, Harald","last_name":"Kuhn","first_name":"Harald"},{"first_name":"Franz-Barthold","last_name":"Gockel","full_name":"Gockel, Franz-Barthold"}]}