{"_id":"39419","doi":"10.1117/12.2502393","language":[{"iso":"eng"}],"author":[{"last_name":"Vidor","full_name":"Vidor, Fabio Fedrizzi","first_name":"Fabio Fedrizzi"},{"last_name":"Meyers","full_name":"Meyers, Thorsten","first_name":"Thorsten"},{"full_name":"Reker, Julia","last_name":"Reker","first_name":"Julia"},{"last_name":"Müller","full_name":"Müller, Kathrin","first_name":"Kathrin"},{"first_name":"Gilson I.","last_name":"Wirth","full_name":"Wirth, Gilson I."},{"id":"20179","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","first_name":"Ulrich"}],"year":"2019","citation":{"apa":"Vidor, F. F., Meyers, T., Reker, J., Müller, K., Wirth, G. I., &#38; Hilleringmann, U. (2019). Mechanical deformation on nanoparticle-based thin-film transistors. In M. du Plessis (Ed.), <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE. <a href=\"https://doi.org/10.1117/12.2502393\">https://doi.org/10.1117/12.2502393</a>","bibtex":"@inproceedings{Vidor_Meyers_Reker_Müller_Wirth_Hilleringmann_2019, title={Mechanical deformation on nanoparticle-based thin-film transistors}, DOI={<a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>}, booktitle={Fifth Conference on Sensors, MEMS, and Electro-Optic Systems}, publisher={SPIE}, author={Vidor, Fabio Fedrizzi and Meyers, Thorsten and Reker, Julia and Müller, Kathrin and Wirth, Gilson I. and Hilleringmann, Ulrich}, editor={du Plessis, Monuko}, year={2019} }","mla":"Vidor, Fabio Fedrizzi, et al. “Mechanical Deformation on Nanoparticle-Based Thin-Film Transistors.” <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis, SPIE, 2019, doi:<a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>.","ieee":"F. F. Vidor, T. Meyers, J. Reker, K. Müller, G. I. Wirth, and U. Hilleringmann, “Mechanical deformation on nanoparticle-based thin-film transistors,” in <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, 2019, doi: <a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>.","short":"F.F. Vidor, T. Meyers, J. Reker, K. Müller, G.I. Wirth, U. Hilleringmann, in: M. du Plessis (Ed.), Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, SPIE, 2019.","chicago":"Vidor, Fabio Fedrizzi, Thorsten Meyers, Julia Reker, Kathrin Müller, Gilson I. Wirth, and Ulrich Hilleringmann. “Mechanical Deformation on Nanoparticle-Based Thin-Film Transistors.” In <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis. SPIE, 2019. <a href=\"https://doi.org/10.1117/12.2502393\">https://doi.org/10.1117/12.2502393</a>.","ama":"Vidor FF, Meyers T, Reker J, Müller K, Wirth GI, Hilleringmann U. Mechanical deformation on nanoparticle-based thin-film transistors. In: du Plessis M, ed. <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE; 2019. doi:<a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>"},"user_id":"20179","date_created":"2023-01-24T10:34:44Z","editor":[{"full_name":"du Plessis, Monuko","last_name":"du Plessis","first_name":"Monuko"}],"status":"public","date_updated":"2023-03-22T10:24:30Z","publication":"Fifth Conference on Sensors, MEMS, and Electro-Optic Systems","department":[{"_id":"59"}],"title":"Mechanical deformation on nanoparticle-based thin-film transistors","publisher":"SPIE","type":"conference","publication_status":"published"}