{"status":"public","_id":"39419","publication_status":"published","date_created":"2023-01-24T10:34:44Z","doi":"10.1117/12.2502393","user_id":"20179","author":[{"full_name":"Vidor, Fabio Fedrizzi","last_name":"Vidor","first_name":"Fabio Fedrizzi"},{"first_name":"Thorsten","last_name":"Meyers","full_name":"Meyers, Thorsten"},{"first_name":"Julia","full_name":"Reker, Julia","last_name":"Reker"},{"first_name":"Kathrin","full_name":"Müller, Kathrin","last_name":"Müller"},{"first_name":"Gilson I.","last_name":"Wirth","full_name":"Wirth, Gilson I."},{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179","first_name":"Ulrich"}],"year":"2019","citation":{"ama":"Vidor FF, Meyers T, Reker J, Müller K, Wirth GI, Hilleringmann U. Mechanical deformation on nanoparticle-based thin-film transistors. In: du Plessis M, ed. Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE; 2019. doi:10.1117/12.2502393","apa":"Vidor, F. F., Meyers, T., Reker, J., Müller, K., Wirth, G. I., & Hilleringmann, U. (2019). Mechanical deformation on nanoparticle-based thin-film transistors. In M. du Plessis (Ed.), Fifth Conference on Sensors, MEMS, and Electro-Optic Systems. SPIE. https://doi.org/10.1117/12.2502393","ieee":"F. F. Vidor, T. Meyers, J. Reker, K. Müller, G. I. Wirth, and U. Hilleringmann, “Mechanical deformation on nanoparticle-based thin-film transistors,” in Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2019, doi: 10.1117/12.2502393.","bibtex":"@inproceedings{Vidor_Meyers_Reker_Müller_Wirth_Hilleringmann_2019, title={Mechanical deformation on nanoparticle-based thin-film transistors}, DOI={10.1117/12.2502393}, booktitle={Fifth Conference on Sensors, MEMS, and Electro-Optic Systems}, publisher={SPIE}, author={Vidor, Fabio Fedrizzi and Meyers, Thorsten and Reker, Julia and Müller, Kathrin and Wirth, Gilson I. and Hilleringmann, Ulrich}, editor={du Plessis, Monuko}, year={2019} }","chicago":"Vidor, Fabio Fedrizzi, Thorsten Meyers, Julia Reker, Kathrin Müller, Gilson I. Wirth, and Ulrich Hilleringmann. “Mechanical Deformation on Nanoparticle-Based Thin-Film Transistors.” In Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, edited by Monuko du Plessis. SPIE, 2019. https://doi.org/10.1117/12.2502393.","short":"F.F. Vidor, T. Meyers, J. Reker, K. Müller, G.I. Wirth, U. Hilleringmann, in: M. du Plessis (Ed.), Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, SPIE, 2019.","mla":"Vidor, Fabio Fedrizzi, et al. “Mechanical Deformation on Nanoparticle-Based Thin-Film Transistors.” Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, edited by Monuko du Plessis, SPIE, 2019, doi:10.1117/12.2502393."},"type":"conference","publisher":"SPIE","department":[{"_id":"59"}],"language":[{"iso":"eng"}],"date_updated":"2023-03-22T10:24:30Z","title":"Mechanical deformation on nanoparticle-based thin-film transistors","editor":[{"first_name":"Monuko","last_name":"du Plessis","full_name":"du Plessis, Monuko"}],"publication":"Fifth Conference on Sensors, MEMS, and Electro-Optic Systems"}