[{"year":"2018","status":"public","title":"Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors","author":[{"last_name":"Becker","first_name":"Thales E.","full_name":"Becker, Thales E."},{"full_name":"Vidor, Fabio F.","first_name":"Fabio F.","last_name":"Vidor"},{"full_name":"Wirth, Gilson I.","first_name":"Gilson I.","last_name":"Wirth"},{"full_name":"Meyers, Thorsten","last_name":"Meyers","first_name":"Thorsten"},{"first_name":"Julia","last_name":"Reker","full_name":"Reker, Julia"},{"id":"20179","last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"}],"date_updated":"2023-03-21T10:15:23Z","publication_status":"published","_id":"39436","publisher":"IEEE","language":[{"iso":"eng"}],"doi":"10.1109/latw.2018.8349695","user_id":"20179","publication":"2018 IEEE 19th Latin-American Test Symposium (LATS)","citation":{"ama":"Becker TE, Vidor FF, Wirth GI, Meyers T, Reker J, Hilleringmann U. Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. In: <i>2018 IEEE 19th Latin-American Test Symposium (LATS)</i>. IEEE; 2018. doi:<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>","bibtex":"@inproceedings{Becker_Vidor_Wirth_Meyers_Reker_Hilleringmann_2018, title={Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors}, DOI={<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>}, booktitle={2018 IEEE 19th Latin-American Test Symposium (LATS)}, publisher={IEEE}, author={Becker, Thales E. and Vidor, Fabio F. and Wirth, Gilson I. and Meyers, Thorsten and Reker, Julia and Hilleringmann, Ulrich}, year={2018} }","mla":"Becker, Thales E., et al. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” <i>2018 IEEE 19th Latin-American Test Symposium (LATS)</i>, IEEE, 2018, doi:<a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>.","short":"T.E. Becker, F.F. Vidor, G.I. Wirth, T. Meyers, J. Reker, U. Hilleringmann, in: 2018 IEEE 19th Latin-American Test Symposium (LATS), IEEE, 2018.","chicago":"Becker, Thales E., Fabio F. Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, and Ulrich Hilleringmann. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” In <i>2018 IEEE 19th Latin-American Test Symposium (LATS)</i>. IEEE, 2018. <a href=\"https://doi.org/10.1109/latw.2018.8349695\">https://doi.org/10.1109/latw.2018.8349695</a>.","apa":"Becker, T. E., Vidor, F. F., Wirth, G. I., Meyers, T., Reker, J., &#38; Hilleringmann, U. (2018). Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. <i>2018 IEEE 19th Latin-American Test Symposium (LATS)</i>. <a href=\"https://doi.org/10.1109/latw.2018.8349695\">https://doi.org/10.1109/latw.2018.8349695</a>","ieee":"T. E. Becker, F. F. Vidor, G. I. Wirth, T. Meyers, J. Reker, and U. Hilleringmann, “Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors,” 2018, doi: <a href=\"https://doi.org/10.1109/latw.2018.8349695\">10.1109/latw.2018.8349695</a>."},"date_created":"2023-01-24T10:50:35Z","type":"conference","department":[{"_id":"59"}]}]