{"_id":"39437","status":"public","type":"conference","publication_status":"published","user_id":"20179","doi":"10.1109/latw.2018.8349695","author":[{"full_name":"Becker, Thales E.","first_name":"Thales E.","last_name":"Becker"},{"full_name":"Vidor, Fabio F.","first_name":"Fabio F.","last_name":"Vidor"},{"last_name":"Wirth","first_name":"Gilson I.","full_name":"Wirth, Gilson I."},{"last_name":"Meyers","first_name":"Thorsten","full_name":"Meyers, Thorsten"},{"first_name":"Julia","full_name":"Reker, Julia","last_name":"Reker"},{"full_name":"Hilleringmann, Ulrich","first_name":"Ulrich","id":"20179","last_name":"Hilleringmann"}],"department":[{"_id":"59"}],"publication":"2018 IEEE 19th Latin-American Test Symposium (LATS)","publisher":"IEEE","date_created":"2023-01-24T10:51:28Z","date_updated":"2023-03-22T10:16:54Z","citation":{"bibtex":"@inproceedings{Becker_Vidor_Wirth_Meyers_Reker_Hilleringmann_2018, title={Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors}, DOI={10.1109/latw.2018.8349695}, booktitle={2018 IEEE 19th Latin-American Test Symposium (LATS)}, publisher={IEEE}, author={Becker, Thales E. and Vidor, Fabio F. and Wirth, Gilson I. and Meyers, Thorsten and Reker, Julia and Hilleringmann, Ulrich}, year={2018} }","ieee":"T. E. Becker, F. F. Vidor, G. I. Wirth, T. Meyers, J. Reker, and U. Hilleringmann, “Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors,” 2018, doi: 10.1109/latw.2018.8349695.","chicago":"Becker, Thales E., Fabio F. Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, and Ulrich Hilleringmann. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” In 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE, 2018. https://doi.org/10.1109/latw.2018.8349695.","short":"T.E. Becker, F.F. Vidor, G.I. Wirth, T. Meyers, J. Reker, U. Hilleringmann, in: 2018 IEEE 19th Latin-American Test Symposium (LATS), IEEE, 2018.","ama":"Becker TE, Vidor FF, Wirth GI, Meyers T, Reker J, Hilleringmann U. Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. In: 2018 IEEE 19th Latin-American Test Symposium (LATS). IEEE; 2018. doi:10.1109/latw.2018.8349695","mla":"Becker, Thales E., et al. “Time Domain Electrical Characterization in Zinc Oxide Nanoparticle Thin-Film Transistors.” 2018 IEEE 19th Latin-American Test Symposium (LATS), IEEE, 2018, doi:10.1109/latw.2018.8349695.","apa":"Becker, T. E., Vidor, F. F., Wirth, G. I., Meyers, T., Reker, J., & Hilleringmann, U. (2018). Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. 2018 IEEE 19th Latin-American Test Symposium (LATS). https://doi.org/10.1109/latw.2018.8349695"},"language":[{"iso":"eng"}],"title":"Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors","year":"2018"}