{"date_created":"2023-01-24T11:04:12Z","year":"2017","department":[{"_id":"59"}],"title":"Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process","author":[{"last_name":"Reker","first_name":"J.","full_name":"Reker, J."},{"first_name":"T.","last_name":"Meyers","full_name":"Meyers, T."},{"last_name":"Vidor","first_name":"F. F.","full_name":"Vidor, F. F."},{"last_name":"Hilleringmann","first_name":"Ulrich","id":"20179","full_name":"Hilleringmann, Ulrich"}],"citation":{"chicago":"Reker, J., T. Meyers, F. F. Vidor, and Ulrich Hilleringmann. “Deposition of ZnO Nanoparticles for Thin-Film Transistors by Doctor Blade Process.” In 2017 IEEE AFRICON. IEEE, 2017. https://doi.org/10.1109/afrcon.2017.8095556.","bibtex":"@inproceedings{Reker_Meyers_Vidor_Hilleringmann_2017, title={Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process}, DOI={10.1109/afrcon.2017.8095556}, booktitle={2017 IEEE AFRICON}, publisher={IEEE}, author={Reker, J. and Meyers, T. and Vidor, F. F. and Hilleringmann, Ulrich}, year={2017} }","ieee":"J. Reker, T. Meyers, F. F. Vidor, and U. Hilleringmann, “Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process,” 2017, doi: 10.1109/afrcon.2017.8095556.","short":"J. Reker, T. Meyers, F.F. Vidor, U. Hilleringmann, in: 2017 IEEE AFRICON, IEEE, 2017.","ama":"Reker J, Meyers T, Vidor FF, Hilleringmann U. Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process. In: 2017 IEEE AFRICON. IEEE; 2017. doi:10.1109/afrcon.2017.8095556","mla":"Reker, J., et al. “Deposition of ZnO Nanoparticles for Thin-Film Transistors by Doctor Blade Process.” 2017 IEEE AFRICON, IEEE, 2017, doi:10.1109/afrcon.2017.8095556.","apa":"Reker, J., Meyers, T., Vidor, F. F., & Hilleringmann, U. (2017). Deposition of ZnO nanoparticles for thin-film transistors by doctor blade process. 2017 IEEE AFRICON. https://doi.org/10.1109/afrcon.2017.8095556"},"status":"public","_id":"39452","publication":"2017 IEEE AFRICON","publisher":"IEEE","type":"conference","date_updated":"2023-03-21T10:10:10Z","user_id":"20179","publication_status":"published","language":[{"iso":"eng"}],"doi":"10.1109/afrcon.2017.8095556"}