{"date_updated":"2023-03-22T10:09:49Z","publication_status":"published","intvolume":"        12","title":"Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor","year":"2013","publication_identifier":{"issn":["1536-125X","1941-0085"]},"author":[{"first_name":"F. F.","last_name":"Vidor","full_name":"Vidor, F. F."},{"first_name":"G.","last_name":"Wirth","full_name":"Wirth, G."},{"last_name":"Assion","first_name":"F.","full_name":"Assion, F."},{"full_name":"Wolff, K.","last_name":"Wolff","first_name":"K."},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich","id":"20179"}],"doi":"10.1109/tnano.2012.2236891","language":[{"iso":"eng"}],"issue":"3","publication":"IEEE Transactions on Nanotechnology","type":"journal_article","keyword":["Electrical and Electronic Engineering","Computer Science Applications"],"department":[{"_id":"59"}],"date_created":"2023-01-24T11:46:28Z","status":"public","user_id":"20179","volume":12,"page":"296-303","_id":"39504","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","citation":{"mla":"Vidor, F. F., et al. “Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor.” <i>IEEE Transactions on Nanotechnology</i>, vol. 12, no. 3, Institute of Electrical and Electronics Engineers (IEEE), 2013, pp. 296–303, doi:<a href=\"https://doi.org/10.1109/tnano.2012.2236891\">10.1109/tnano.2012.2236891</a>.","bibtex":"@article{Vidor_Wirth_Assion_Wolff_Hilleringmann_2013, title={Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor}, volume={12}, DOI={<a href=\"https://doi.org/10.1109/tnano.2012.2236891\">10.1109/tnano.2012.2236891</a>}, number={3}, journal={IEEE Transactions on Nanotechnology}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Vidor, F. F. and Wirth, G. and Assion, F. and Wolff, K. and Hilleringmann, Ulrich}, year={2013}, pages={296–303} }","ama":"Vidor FF, Wirth G, Assion F, Wolff K, Hilleringmann U. Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor. <i>IEEE Transactions on Nanotechnology</i>. 2013;12(3):296-303. doi:<a href=\"https://doi.org/10.1109/tnano.2012.2236891\">10.1109/tnano.2012.2236891</a>","ieee":"F. F. Vidor, G. Wirth, F. Assion, K. Wolff, and U. Hilleringmann, “Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor,” <i>IEEE Transactions on Nanotechnology</i>, vol. 12, no. 3, pp. 296–303, 2013, doi: <a href=\"https://doi.org/10.1109/tnano.2012.2236891\">10.1109/tnano.2012.2236891</a>.","apa":"Vidor, F. F., Wirth, G., Assion, F., Wolff, K., &#38; Hilleringmann, U. (2013). Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor. <i>IEEE Transactions on Nanotechnology</i>, <i>12</i>(3), 296–303. <a href=\"https://doi.org/10.1109/tnano.2012.2236891\">https://doi.org/10.1109/tnano.2012.2236891</a>","short":"F.F. Vidor, G. Wirth, F. Assion, K. Wolff, U. Hilleringmann, IEEE Transactions on Nanotechnology 12 (2013) 296–303.","chicago":"Vidor, F. F., G. Wirth, F. Assion, K. Wolff, and Ulrich Hilleringmann. “Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor.” <i>IEEE Transactions on Nanotechnology</i> 12, no. 3 (2013): 296–303. <a href=\"https://doi.org/10.1109/tnano.2012.2236891\">https://doi.org/10.1109/tnano.2012.2236891</a>."}}