---
res:
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: Torsten
      foaf_name: Frers, Torsten
      foaf_surname: Frers
  - foaf_Person:
      foaf_givenName: Thomas
      foaf_name: Hett, Thomas
      foaf_surname: Hett
  - foaf_Person:
      foaf_givenName: Ulrich
      foaf_name: Hilleringmann, Ulrich
      foaf_surname: Hilleringmann
      foaf_workInfoHomepage: http://www.librecat.org/personId=20179
  - foaf_Person:
      foaf_givenName: Gerhard
      foaf_name: Berth, Gerhard
      foaf_surname: Berth
  - foaf_Person:
      foaf_givenName: Alex
      foaf_name: Widhalm, Alex
      foaf_surname: Widhalm
  - foaf_Person:
      foaf_givenName: Artur
      foaf_name: Zrenner, Artur
      foaf_surname: Zrenner
  bibo_doi: 10.1109/scd.2011.6068744
  dct_date: 2011^xs_gYear
  dct_language: eng
  dct_publisher: IEEE@
  dct_title: Characterization of SiON integrated waveguides via FTIR and AFM measurements@
...