{"user_id":"20179","title":"Characterization and Matching Analysis of 50 nm-NMOS-Transistors","publication":"ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference","department":[{"_id":"59"}],"author":[{"full_name":"Horstmann, J. T.","first_name":"J. T.","last_name":"Horstmann"},{"full_name":"Hilleringmann, Ulrich","first_name":"Ulrich","id":"20179","last_name":"Hilleringmann"},{"first_name":"K.","full_name":"Goser, K.","last_name":"Goser"}],"date_created":"2023-01-25T09:20:58Z","status":"public","_id":"39900","date_updated":"2023-03-21T09:53:33Z","language":[{"iso":"eng"}],"page":"253-256","year":"1996","citation":{"short":"J.T. Horstmann, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–256.","ieee":"J. T. Horstmann, U. Hilleringmann, and K. Goser, “Characterization and Matching Analysis of 50 nm-NMOS-Transistors,” in ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–256.","chicago":"Horstmann, J. T., Ulrich Hilleringmann, and K. Goser. “Characterization and Matching Analysis of 50 Nm-NMOS-Transistors.” In ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–56, 1996.","apa":"Horstmann, J. T., Hilleringmann, U., & Goser, K. (1996). Characterization and Matching Analysis of 50 nm-NMOS-Transistors. ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–256.","ama":"Horstmann JT, Hilleringmann U, Goser K. Characterization and Matching Analysis of 50 nm-NMOS-Transistors. In: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference. ; 1996:253-256.","bibtex":"@inproceedings{Horstmann_Hilleringmann_Goser_1996, title={Characterization and Matching Analysis of 50 nm-NMOS-Transistors}, booktitle={ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference}, author={Horstmann, J. T. and Hilleringmann, Ulrich and Goser, K.}, year={1996}, pages={253–256} }","mla":"Horstmann, J. T., et al. “Characterization and Matching Analysis of 50 Nm-NMOS-Transistors.” ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–56."},"type":"conference"}