{"user_id":"20179","publication":"ESSDERC ’93: 23rd European solid State Device Research Conference","date_created":"2023-01-25T09:26:00Z","department":[{"_id":"59"}],"author":[{"first_name":"I.","full_name":"Schonstein, I.","last_name":"Schonstein"},{"last_name":"Muller","full_name":"Muller, J.","first_name":"J."},{"id":"20179","first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"},{"first_name":"K.","last_name":"Goser","full_name":"Goser, K."}],"title":"Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission","type":"conference","_id":"39910","status":"public","language":[{"iso":"eng"}],"citation":{"short":"I. Schonstein, J. Muller, U. Hilleringmann, K. Goser, in: ESSDERC ’93: 23rd European Solid State Device Research Conference, 1993, pp. 421–424.","ama":"Schonstein I, Muller J, Hilleringmann U, Goser K. Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission. In: <i>ESSDERC ’93: 23rd European Solid State Device Research Conference</i>. ; 1993:421-424.","apa":"Schonstein, I., Muller, J., Hilleringmann, U., &#38; Goser, K. (1993). Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission. <i>ESSDERC ’93: 23rd European Solid State Device Research Conference</i>, 421–424.","bibtex":"@inproceedings{Schonstein_Muller_Hilleringmann_Goser_1993, title={Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission}, booktitle={ESSDERC ’93: 23rd European solid State Device Research Conference}, author={Schonstein, I. and Muller, J. and Hilleringmann, Ulrich and Goser, K.}, year={1993}, pages={421–424} }","ieee":"I. Schonstein, J. Muller, U. Hilleringmann, and K. Goser, “Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission,” in <i>ESSDERC ’93: 23rd European solid State Device Research Conference</i>, 1993, pp. 421–424.","chicago":"Schonstein, I., J. Muller, Ulrich Hilleringmann, and K. Goser. “Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission.” In <i>ESSDERC ’93: 23rd European Solid State Device Research Conference</i>, 421–24, 1993.","mla":"Schonstein, I., et al. “Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission.” <i>ESSDERC ’93: 23rd European Solid State Device Research Conference</i>, 1993, pp. 421–24."},"year":"1993","date_updated":"2023-03-21T09:50:23Z","page":"421-424"}