Characterization of submicron NMOS devices due to visible light emission Schönstein, I. Müller, J. Hilleringmann, Ulrich Goser, K. Electrical and Electronic Engineering Surfaces Coatings and Films Condensed Matter Physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Elsevier BV 2002 info:eu-repo/semantics/article doc-type:article text http://purl.org/coar/resource_type/c_6501 https://ris.uni-paderborn.de/record/39912 Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron NMOS devices due to visible light emission. <i>Microelectronic Engineering</i>. 2002;21(1-4):363-366. doi:<a href="https://doi.org/10.1016/0167-9317(93)90092-j">10.1016/0167-9317(93)90092-j</a> eng info:eu-repo/semantics/altIdentifier/doi/10.1016/0167-9317(93)90092-j info:eu-repo/semantics/altIdentifier/issn/0167-9317 info:eu-repo/semantics/closedAccess