Characterization of submicron NMOS devices due to visible light emission - Schönstein, I.; Müller, J.; Hilleringmann, Ulrich; Goser, K. (Microelectronic Engineering, 2002)
published
Keywords: article; Electrical and Electronic Engineering -- Surfaces -- Coatings and Films -- Condensed Matter Physics -- Atomic and Molecular Physics -- and Optics -- Electronic -- Optical and Magnetic Materials