{"_id":"39940","language":[{"iso":"eng"}],"year":"2019","author":[{"first_name":"Dominik","last_name":"Schroeder","full_name":"Schroeder, Dominik"},{"last_name":"Hangmann","full_name":"Hangmann, Christian","first_name":"Christian"},{"full_name":"Hedayat, Christian","last_name":"Hedayat","first_name":"Christian"},{"first_name":"Thomas","full_name":"Otto, Thomas","last_name":"Otto"},{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","first_name":"Ulrich","id":"20179"}],"citation":{"mla":"Schroeder, Dominik, et al. “Characterization of H-Field Probes Regarding Unwanted Field Suppression Using Different Calibration Structures.” <i>Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems</i>, 2019, pp. 1–4.","apa":"Schroeder, D., Hangmann, C., Hedayat, C., Otto, T., &#38; Hilleringmann, U. (2019). Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures. <i>Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems</i>, 1–4.","bibtex":"@inproceedings{Schroeder_Hangmann_Hedayat_Otto_Hilleringmann_2019, title={Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures}, booktitle={Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems}, author={Schroeder, Dominik and Hangmann, Christian and Hedayat, Christian and Otto, Thomas and Hilleringmann, Ulrich}, year={2019}, pages={1–4} }","ieee":"D. Schroeder, C. Hangmann, C. Hedayat, T. Otto, and U. Hilleringmann, “Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures,” in <i>Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems</i>, 2019, pp. 1–4.","chicago":"Schroeder, Dominik, Christian Hangmann, Christian Hedayat, Thomas Otto, and Ulrich Hilleringmann. “Characterization of H-Field Probes Regarding Unwanted Field Suppression Using Different Calibration Structures.” In <i>Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems</i>, 1–4, 2019.","ama":"Schroeder D, Hangmann C, Hedayat C, Otto T, Hilleringmann U. Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures. In: <i>Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems</i>. ; 2019:1-4.","short":"D. Schroeder, C. Hangmann, C. Hedayat, T. Otto, U. Hilleringmann, in: Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems, 2019, pp. 1–4."},"status":"public","date_created":"2023-01-25T09:49:22Z","user_id":"20179","page":"1-4","title":"Characterization of H-field Probes regarding Unwanted Field Suppression using Different Calibration Structures","department":[{"_id":"59"}],"publication":"Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems","date_updated":"2023-03-22T10:37:24Z","type":"conference"}