---
res:
  bibo_abstract:
  - "We report the influence of {111} stacking faults on the cathodoluminescence (CL)
    emission characteristics of\r\ncubic GaN (c-GaN) films and cubic GaN/AlN multiquantum
    wells. Transmission electron microscopy\r\n(TEM) measurements indicate that stacking
    faults (SFs) on the {111} planes are the predominant crystallographic\r\ndefects
    in epitaxial films, which were grown on 3CSiC/ Si (001) substrates by plasma-assisted
    molecular\r\nbeam epitaxy. The correlation of the SFs and the luminescence output
    is evidenced with a CL setup\r\nintegrated in a scanning TEM (STEM). By comparing
    the STEM images and the simultaneously measured CL\r\nsignals it is demonstrated
    that SFs in these films lead to a reduced CL emission intensity. Furthermore,
    the CL\r\nemission intensity is shown to increase with increasing film thickness
    and decreasing SF density. This\r\ncorrelation can be connected to the reduction
    of the full width at half maximum of X-ray diffraction rocking\r\ncurves with
    increasing film thickness of c-GaN films.@eng"
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: R. M.
      foaf_name: Kemper, R. M.
      foaf_surname: Kemper
  - foaf_Person:
      foaf_givenName: P.
      foaf_name: Veit, P.
      foaf_surname: Veit
  - foaf_Person:
      foaf_givenName: C.
      foaf_name: Mietze, C.
      foaf_surname: Mietze
  - foaf_Person:
      foaf_givenName: A.
      foaf_name: Dempewolf, A.
      foaf_surname: Dempewolf
  - foaf_Person:
      foaf_givenName: T.
      foaf_name: Wecker, T.
      foaf_surname: Wecker
  - foaf_Person:
      foaf_givenName: F.
      foaf_name: Bertram, F.
      foaf_surname: Bertram
  - foaf_Person:
      foaf_givenName: J.
      foaf_name: Christen, J.
      foaf_surname: Christen
  - foaf_Person:
      foaf_givenName: Jörg
      foaf_name: Lindner, Jörg
      foaf_surname: Lindner
      foaf_workInfoHomepage: http://www.librecat.org/personId=20797
  - foaf_Person:
      foaf_givenName: D. J.
      foaf_name: As, D. J.
      foaf_surname: As
  bibo_doi: 10.1002/pssc.201400154
  bibo_issue: 4-5
  bibo_volume: 12
  dct_date: 2015^xs_gYear
  dct_isPartOf:
  - http://id.crossref.org/issn/1862-6351
  dct_language: eng
  dct_publisher: Wiley@
  dct_title: STEM-CL investigations on the influence of stacking faults on the optical
    emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells@
...