---
_id: '4027'
abstract:
- lang: eng
  text: "We report the influence of {111} stacking faults on the cathodoluminescence
    (CL) emission characteristics of\r\ncubic GaN (c-GaN) films and cubic GaN/AlN
    multiquantum wells. Transmission electron microscopy\r\n(TEM) measurements indicate
    that stacking faults (SFs) on the {111} planes are the predominant crystallographic\r\ndefects
    in epitaxial films, which were grown on 3CSiC/ Si (001) substrates by plasma-assisted
    molecular\r\nbeam epitaxy. The correlation of the SFs and the luminescence output
    is evidenced with a CL setup\r\nintegrated in a scanning TEM (STEM). By comparing
    the STEM images and the simultaneously measured CL\r\nsignals it is demonstrated
    that SFs in these films lead to a reduced CL emission intensity. Furthermore,
    the CL\r\nemission intensity is shown to increase with increasing film thickness
    and decreasing SF density. This\r\ncorrelation can be connected to the reduction
    of the full width at half maximum of X-ray diffraction rocking\r\ncurves with
    increasing film thickness of c-GaN films."
article_type: original
author:
- first_name: R. M.
  full_name: Kemper, R. M.
  last_name: Kemper
- first_name: P.
  full_name: Veit, P.
  last_name: Veit
- first_name: C.
  full_name: Mietze, C.
  last_name: Mietze
- first_name: A.
  full_name: Dempewolf, A.
  last_name: Dempewolf
- first_name: T.
  full_name: Wecker, T.
  last_name: Wecker
- first_name: F.
  full_name: Bertram, F.
  last_name: Bertram
- first_name: J.
  full_name: Christen, J.
  last_name: Christen
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: D. J.
  full_name: As, D. J.
  last_name: As
citation:
  ama: Kemper RM, Veit P, Mietze C, et al. STEM-CL investigations on the influence
    of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN
    multi-quantum wells. <i>physica status solidi (c)</i>. 2015;12(4-5):469-472. doi:<a
    href="https://doi.org/10.1002/pssc.201400154">10.1002/pssc.201400154</a>
  apa: Kemper, R. M., Veit, P., Mietze, C., Dempewolf, A., Wecker, T., Bertram, F.,
    … As, D. J. (2015). STEM-CL investigations on the influence of stacking faults
    on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum
    wells. <i>Physica Status Solidi (C)</i>, <i>12</i>(4–5), 469–472. <a href="https://doi.org/10.1002/pssc.201400154">https://doi.org/10.1002/pssc.201400154</a>
  bibtex: '@article{Kemper_Veit_Mietze_Dempewolf_Wecker_Bertram_Christen_Lindner_As_2015,
    title={STEM-CL investigations on the influence of stacking faults on the optical
    emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells}, volume={12},
    DOI={<a href="https://doi.org/10.1002/pssc.201400154">10.1002/pssc.201400154</a>},
    number={4–5}, journal={physica status solidi (c)}, publisher={Wiley}, author={Kemper,
    R. M. and Veit, P. and Mietze, C. and Dempewolf, A. and Wecker, T. and Bertram,
    F. and Christen, J. and Lindner, Jörg and As, D. J.}, year={2015}, pages={469–472}
    }'
  chicago: 'Kemper, R. M., P. Veit, C. Mietze, A. Dempewolf, T. Wecker, F. Bertram,
    J. Christen, Jörg Lindner, and D. J. As. “STEM-CL Investigations on the Influence
    of Stacking Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN
    Multi-Quantum Wells.” <i>Physica Status Solidi (C)</i> 12, no. 4–5 (2015): 469–72.
    <a href="https://doi.org/10.1002/pssc.201400154">https://doi.org/10.1002/pssc.201400154</a>.'
  ieee: R. M. Kemper <i>et al.</i>, “STEM-CL investigations on the influence of stacking
    faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum
    wells,” <i>physica status solidi (c)</i>, vol. 12, no. 4–5, pp. 469–472, 2015.
  mla: Kemper, R. M., et al. “STEM-CL Investigations on the Influence of Stacking
    Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN Multi-Quantum
    Wells.” <i>Physica Status Solidi (C)</i>, vol. 12, no. 4–5, Wiley, 2015, pp. 469–72,
    doi:<a href="https://doi.org/10.1002/pssc.201400154">10.1002/pssc.201400154</a>.
  short: R.M. Kemper, P. Veit, C. Mietze, A. Dempewolf, T. Wecker, F. Bertram, J.
    Christen, J. Lindner, D.J. As, Physica Status Solidi (C) 12 (2015) 469–472.
date_created: 2018-08-21T13:17:46Z
date_updated: 2022-01-06T07:00:08Z
ddc:
- '530'
department:
- _id: '286'
- _id: '15'
doi: 10.1002/pssc.201400154
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-21T13:18:38Z
  date_updated: 2018-08-21T13:18:38Z
  file_id: '4028'
  file_name: STEM-CL investigations on the influence of stacking faults on the optical
    emission of cubic GaN epilayers and cubic GaN-AlN multi-quantum wells.pdf
  file_size: 447603
  relation: main_file
  success: 1
file_date_updated: 2018-08-21T13:18:38Z
has_accepted_license: '1'
intvolume: '        12'
issue: 4-5
language:
- iso: eng
page: 469-472
publication: physica status solidi (c)
publication_identifier:
  issn:
  - 1862-6351
publication_status: published
publisher: Wiley
status: public
title: STEM-CL investigations on the influence of stacking faults on the optical emission
  of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells
type: journal_article
user_id: '55706'
volume: 12
year: '2015'
...