{"title":"STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells","conference":{"end_date":"2014-05-30","location":"Lille (France)","name":"European Materials Research Society Spring Meeting 2014","start_date":"2014-05-26"},"date_updated":"2022-01-06T07:00:12Z","date_created":"2018-08-22T12:26:49Z","author":[{"first_name":"R.M.","last_name":"Kemper","full_name":"Kemper, R.M."},{"first_name":"P.","full_name":"Veit, P.","last_name":"Veit"},{"first_name":"C. ","full_name":"Mietze, C. ","last_name":"Mietze"},{"last_name":"Dempewolf","full_name":"Dempewolf, A.","first_name":"A."},{"first_name":"T. ","full_name":"Wecker, T. ","last_name":"Wecker"},{"first_name":"J.","last_name":"Christen","full_name":"Christen, J."},{"first_name":"D.","last_name":"As","full_name":"As, D."},{"first_name":"Jörg","id":"20797","full_name":"Lindner, Jörg","last_name":"Lindner"}],"year":"2014","citation":{"apa":"Kemper, R. M., Veit, P., Mietze, C., Dempewolf, A., Wecker, T., Christen, J., … Lindner, J. (2014). STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells. Presented at the European Materials Research Society Spring Meeting 2014, Lille (France).","short":"R.M. Kemper, P. Veit, C. Mietze, A. Dempewolf, T. Wecker, J. Christen, D. As, J. Lindner, in: 2014.","bibtex":"@inproceedings{Kemper_Veit_Mietze_Dempewolf_Wecker_Christen_As_Lindner_2014, title={STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells}, author={Kemper, R.M. and Veit, P. and Mietze, C.  and Dempewolf, A. and Wecker, T.  and Christen, J. and As, D. and Lindner, Jörg}, year={2014} }","mla":"Kemper, R. M., et al. <i>STEM-CL Investigations on the Influence of Stacking Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN Multi-Quantum Wells</i>. 2014.","ama":"Kemper RM, Veit P, Mietze C, et al. STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells. In: ; 2014.","chicago":"Kemper, R.M., P. Veit, C.  Mietze, A. Dempewolf, T.  Wecker, J. Christen, D. As, and Jörg Lindner. “STEM-CL Investigations on the Influence of Stacking Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN Multi-Quantum Wells,” 2014.","ieee":"R. M. Kemper <i>et al.</i>, “STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells,” presented at the European Materials Research Society Spring Meeting 2014, Lille (France), 2014."},"language":[{"iso":"eng"}],"_id":"4069","department":[{"_id":"15"},{"_id":"286"}],"user_id":"55706","status":"public","type":"conference"}