{"date_updated":"2022-01-06T07:00:12Z","year":"2014","citation":{"apa":"Kemper, R. M., Veit, P., Mietze, C., Dempewolf, A., Wecker, T., Christen, J., … Lindner, J. (2014). STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells. Presented at the European Materials Research Society Spring Meeting 2014, Lille (France).","ama":"Kemper RM, Veit P, Mietze C, et al. STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells. In: ; 2014.","bibtex":"@inproceedings{Kemper_Veit_Mietze_Dempewolf_Wecker_Christen_As_Lindner_2014, title={STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells}, author={Kemper, R.M. and Veit, P. and Mietze, C.  and Dempewolf, A. and Wecker, T.  and Christen, J. and As, D. and Lindner, Jörg}, year={2014} }","ieee":"R. M. Kemper <i>et al.</i>, “STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells,” presented at the European Materials Research Society Spring Meeting 2014, Lille (France), 2014.","chicago":"Kemper, R.M., P. Veit, C.  Mietze, A. Dempewolf, T.  Wecker, J. Christen, D. As, and Jörg Lindner. “STEM-CL Investigations on the Influence of Stacking Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN Multi-Quantum Wells,” 2014.","mla":"Kemper, R. M., et al. <i>STEM-CL Investigations on the Influence of Stacking Faults on the Optical Emission of Cubic GaN Epilayers and Cubic GaN/AlN Multi-Quantum Wells</i>. 2014.","short":"R.M. Kemper, P. Veit, C. Mietze, A. Dempewolf, T. Wecker, J. Christen, D. As, J. Lindner, in: 2014."},"language":[{"iso":"eng"}],"status":"public","_id":"4069","conference":{"name":"European Materials Research Society Spring Meeting 2014","end_date":"2014-05-30","location":"Lille (France)","start_date":"2014-05-26"},"type":"conference","title":"STEM-CL investigations on the influence of stacking faults on the optical emission of cubic GaN epilayers and cubic GaN/AlN multi-quantum wells","author":[{"full_name":"Kemper, R.M.","last_name":"Kemper","first_name":"R.M."},{"first_name":"P.","last_name":"Veit","full_name":"Veit, P."},{"full_name":"Mietze, C. ","last_name":"Mietze","first_name":"C. "},{"full_name":"Dempewolf, A.","last_name":"Dempewolf","first_name":"A."},{"first_name":"T. ","last_name":"Wecker","full_name":"Wecker, T. "},{"first_name":"J.","full_name":"Christen, J.","last_name":"Christen"},{"first_name":"D.","last_name":"As","full_name":"As, D."},{"full_name":"Lindner, Jörg","last_name":"Lindner","first_name":"Jörg","id":"20797"}],"department":[{"_id":"15"},{"_id":"286"}],"date_created":"2018-08-22T12:26:49Z","user_id":"55706"}