{"_id":"40696","status":"public","date_created":"2023-01-30T11:51:38Z","year":"2018","author":[{"first_name":"S.","last_name":"Smirnov","full_name":"Smirnov, S."},{"first_name":"A.","last_name":"Eguizabal","full_name":"Eguizabal, A."}],"user_id":"43497","citation":{"chicago":"Smirnov, S., and A. Eguizabal. “DEEP LEARNING FOR OBJECT DETECTION IN FINE-ART PAINTINGS.” In 2018 IEEE International Conference on Metrology for Archaeology and Cultural Heritage, 2018.","mla":"Smirnov, S., and A. Eguizabal. “DEEP LEARNING FOR OBJECT DETECTION IN FINE-ART PAINTINGS.” 2018 IEEE International Conference on Metrology for Archaeology and Cultural Heritage, 2018.","apa":"Smirnov, S., & Eguizabal, A. (2018). DEEP LEARNING FOR OBJECT DETECTION IN FINE-ART PAINTINGS. 2018 IEEE International Conference on Metrology for Archaeology and Cultural Heritage.","short":"S. Smirnov, A. Eguizabal, in: 2018 IEEE International Conference on Metrology for Archaeology and Cultural Heritage, 2018.","ama":"Smirnov S, Eguizabal A. DEEP LEARNING FOR OBJECT DETECTION IN FINE-ART PAINTINGS. In: 2018 IEEE International Conference on Metrology for Archaeology and Cultural Heritage. ; 2018.","ieee":"S. Smirnov and A. Eguizabal, “DEEP LEARNING FOR OBJECT DETECTION IN FINE-ART PAINTINGS,” 2018.","bibtex":"@inproceedings{Smirnov_Eguizabal_2018, title={DEEP LEARNING FOR OBJECT DETECTION IN FINE-ART PAINTINGS}, booktitle={2018 IEEE International Conference on Metrology for Archaeology and Cultural Heritage}, author={Smirnov, S. and Eguizabal, A.}, year={2018} }"},"type":"conference","department":[{"_id":"263"}],"date_updated":"2023-01-30T12:02:40Z","title":"DEEP LEARNING FOR OBJECT DETECTION IN FINE-ART PAINTINGS","publication":"2018 IEEE International Conference on Metrology for Archaeology and Cultural Heritage"}