{"_id":"40723","user_id":"43497","type":"conference","author":[{"last_name":"Hasija","full_name":"Hasija, Tanuj","first_name":"Tanuj","id":"43497"},{"last_name":"Song","full_name":"Song, Yang","first_name":"Yang"},{"last_name":"Schreier","full_name":"Schreier, Peter J.","first_name":"Peter J."},{"first_name":"David","last_name":"Ramírez","full_name":"Ramírez, David"}],"department":[{"_id":"263"}],"title":"Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime","date_created":"2023-01-30T11:51:42Z","publication":"Proc.\\ IEEE Work.\\ Stat.\\ Signal Process.","place":"Palma de Mallorca, Spain","year":"2016","citation":{"mla":"Hasija, Tanuj, et al. “Detecting the Dimension of the Subspace Correlated across Multiple Data Sets in the Sample Poor Regime.” <i>Proc.\\ IEEE Work.\\ Stat.\\ Signal Process.</i>, 2016.","chicago":"Hasija, Tanuj, Yang Song, Peter J. Schreier, and David Ramírez. “Detecting the Dimension of the Subspace Correlated across Multiple Data Sets in the Sample Poor Regime.” In <i>Proc.\\ IEEE Work.\\ Stat.\\ Signal Process.</i> Palma de Mallorca, Spain, 2016.","ieee":"T. Hasija, Y. Song, P. J. Schreier, and D. Ramírez, “Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime,” 2016.","bibtex":"@inproceedings{Hasija_Song_Schreier_Ramírez_2016, place={Palma de Mallorca, Spain}, title={Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime}, booktitle={Proc.\\ IEEE Work.\\ Stat.\\ Signal Process.}, author={Hasija, Tanuj and Song, Yang and Schreier, Peter J. and Ramírez, David}, year={2016} }","apa":"Hasija, T., Song, Y., Schreier, P. J., &#38; Ramírez, D. (2016). Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime. <i>Proc.\\ IEEE Work.\\ Stat.\\ Signal Process.</i>","ama":"Hasija T, Song Y, Schreier PJ, Ramírez D. Detecting the dimension of the subspace correlated across multiple data sets in the sample poor regime. In: <i>Proc.\\ IEEE Work.\\ Stat.\\ Signal Process.</i> ; 2016.","short":"T. Hasija, Y. Song, P.J. Schreier, D. Ramírez, in: Proc.\\ IEEE Work.\\ Stat.\\ Signal Process., Palma de Mallorca, Spain, 2016."},"date_updated":"2023-01-30T12:07:23Z","status":"public","language":[{"iso":"eng"}]}