Formation of defects in cubic GaN grown on nano-patterned 3C-SiC (001)
R.M. Kemper, M. Häberlen, T. Schupp, M. Weinl, M. Bürger, M. Ruth, C. Meier, T. Niendorf, H.J. Maier, K. Lischka, D.J. As, J. Lindner, Physica Status Solidi (C) 9 (2012) 1028–1031.